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Cited by 178

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Jumping mode scanning force microscopy

de Pablo, P. J., Colchero, J., Gómez-Herrero, J., Baró, A. M.·1998·Applied Physics Letters
DOI 10.1063/1.122751
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Abstract

In this letter, we present a new scanning probe microscopy mode, jumping mode, which allows the simultaneous measurement of the topography and of some other physical property of the sample. Essentially, at each image point first the topography of the sample is measured during a feedback phase of a cycle, and then the tip–sample interaction is evaluated in real time as the tip is moved away and towards the sample. Since the lateral motion is done out of contact the method is free, or nearly free, of shear forces. The general advantages of jumping mode are discussed. Finally, two different applications of this mode are presented. In addition to the topography, the first application measures the adhesion between the tip and the sample, while the second determines the corresponding electrostatic interaction.

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Metadata

Authors
de Pablo, P. J., Colchero, J., Gómez-Herrero, J., & Baró, A. M.
Venue
Applied Physics Letters
Publisher
AIP Publishing
Published
1998-11-30
Volume
73
Issue
22
Pages
3300-3302
ISSN
  • 0003-6951 (ISSN-L)
  • 1077-3118
DOI
10.1063/1.122751
OpenAlex
W2036602796
Cited by
178
References
0
FWCI
3.68
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: Jumping mode scanning force microscopy. https://app.cochat.ai/papers/10.1063/1.122751
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de Pablo, P. J., Colchero, J., Gómez-Herrero, J., & Baró, A. M. (1998). Jumping mode scanning force microscopy. Applied Physics Letters. https://doi.org/10.1063/1.122751

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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.