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Strain-dependent electrical resistance of tin-doped indium oxide on polymer substrates
Abstract
The increase in sheet resistance of indium–tin–oxide (ITO) films on polyethylene terephthalate with increasing tensile strain is reported. The increase in resistance is related to the number of cracks in the conducting layer which depends upon applied strain and film thickness. We propose a simple model that describes the finite but increasing resistance in the cracked ITO layer in terms of a small volume of conducting material within each crack.
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Yu, Z., Zhang, Q., Li, L., Chen, Q., Niu, X., Liu, J., & Pei, Q. (2011) · Advanced Materials · doi:10.1002/adma.201003398 · Cited by 688
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Metadata
- Authors
- Cairns, D. R., Witte, R. P., Sparacin, D. K., Sachsman, S. M., Paine, D. C., Crawford, G. P., & Newton, R. R.
- Venue
- Applied Physics Letters
- Publisher
- AIP Publishing
- Published
- 2000-03-13
- Volume
- 76
- Issue
- 11
- Pages
- 1425-1427
- ISSN
- 0003-6951 (ISSN-L)
- 1077-3118
- OpenAlex
- W1980249368
- Cited by
- 616
- References
- 0
- FWCI
- 11.26
- Type
- journal article
- Language
- en
- Open access
- closed
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- Cairns, D. R., Witte, R. P., Sparacin, D. K., Sachsman, S. M., Paine, D. C., Crawford, G. P., & Newton, R. R. (2000). Strain-dependent electrical resistance of tin-doped indium oxide on polymer substrates. Applied Physics Letters. https://doi.org/10.1063/1.126052
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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
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