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Size-induced lattice relaxation in CeO2 nanoparticles
Abstract
Size-induced lattice relaxation was observed for nanoscale CeO2 single crystals with an average size from 4 to 60 nm. Results showed the finest crystallites exhibited no strain-induced line broadening, while high temperature annealing resulted in larger grain sizes and significant strains. The observed shift in the x-ray diffraction lattice parameters was assumed to be due to the formation of defects on the lattice, specifically oxygen vacancies. Modeling revealed that the oxygen vacancy concentration ([VO••]) was found to be ≈4×1020/cm3 for the 4 nm crystallites, and decreased two orders of magnitude for larger 60 nm single crystals.
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Shannon, R. D. (1976) · Acta Crystallographica Section A · doi:10.1107/s0567739476001551 · Cited by 66,145
Perspectives on the Physical Chemistry of Semiconductor Nanocrystals
Alivisatos, A. P. (1996) · The Journal of Physical Chemistry · doi:10.1021/jp9535506 · Cited by 3,595
Cited by
Oxygen vacancies in metal oxides: recent progress towards advanced catalyst design
Zhuang, G., Chen, Y., Zhuang, Z., Yu, Y., & Yu, J. (2020) · Science China Materials · doi:10.1007/s40843-020-1305-6 · Cited by 499
Gamarra, D., Munuera, G., Hungría, A. B., Fernández-García, M., Conesa, J. C., Midgley, P. A., Wang, X. Q., Hanson, J. C., Rodríguez, J. A., & Martínez-Arias, A. (2007) · The Journal of Physical Chemistry C · doi:10.1021/jp072243k · Cited by 332
Metadata
- Authors
- Zhou, X.-D., & Huebner, W.
- Venue
- Applied Physics Letters
- Publisher
- AIP Publishing
- Published
- 2001-11-19
- Volume
- 79
- Issue
- 21
- Pages
- 3512-3514
- ISSN
- 0003-6951 (ISSN-L)
- 1077-3118
- OpenAlex
- W1974159114
- Cited by
- 368
- References
- 2
- FWCI
- 5.39
- Type
- journal article
- Language
- en
- Open access
- closed
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