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Cited by 237

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Lattice Constants and Thermal Expansivities of Silicon and of Calcium Fluoride between 6° and 322°K

Batchelder, D. N., Simmons, R. O.·1964·The Journal of Chemical Physics

Abstract

An x-ray back-reflection, rotating-camera technique has been used to obtain lattice constants and thermal expansivities of single-crystal silicon and calcium fluoride. Absolute expansivity was obtained over a broad range with an error less than 3 ppm. For silicon, this absolute method discriminates between earlier experiments showing some disagreement, and establishes with improved precision the temperature variation of the Grüneisen parameter γ in the region of particular interest (γ<0). For calcium fluoride the present x-ray measurements test a prediction of Ganesan and Srinivasan that γ should rise sharply below about 80°K. The prediction is not confirmed.

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Metadata

Authors
Batchelder, D. N., & Simmons, R. O.
Venue
The Journal of Chemical Physics
Published
1964-10-15
Volume
41
Issue
8
Pages
2324-2329
ISSN
  • 0021-9606 (ISSN-L)
  • 1089-7690
OpenAlex
W2002019385
Cited by
237
References
0
FWCI
6.78
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: Lattice Constants and Thermal Expansivities of Silicon and of Calcium Fluoride between 6° and 322°K. https://app.cochat.ai/papers/10.1063/1.1726266
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Batchelder, D. N., & Simmons, R. O. (1964). Lattice Constants and Thermal Expansivities of Silicon and of Calcium Fluoride between 6° and 322°K. The Journal of Chemical Physics. https://doi.org/10.1063/1.1726266

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