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Hysteretic current–voltage characteristics and resistance switching at a rectifying Ti∕Pr0.7Ca0.3MnO3 interface

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Sawa, A., Fujii, T., Kawasaki, M., Tokura, Y.·2004·Applied Physics Letters
DOI 10.1063/1.1812580
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Abstract

We have characterized the vertical transport properties of epitaxial layered structures composed of Pr0.7Ca0.3MnO3(PCMO) sandwiched between SrRuO3(SRO) bottom electrode and several kinds of top electrodes such as SRO, Pt, Au, Ag, and Ti. Among the layered structures, Ti∕PCMO∕SRO is distinct due to a rectifying I–V characteristic with a large hysteresis. Corresponding to the hysteresis of the I–V characteristics, the contact resistance of the Ti∕PCMO interface reversibly switches between two stable states by applying pulsed voltage stress. We propose a model for the resistance switching at the Ti∕PCMO interface, in which the width and/or height of a Schottky-like barrier are altered by trapped charge carriers in the interface states.

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Metadata

Authors
Sawa, A., Fujii, T., Kawasaki, M., & Tokura, Y.
Venue
Applied Physics Letters
Publisher
AIP Publishing
Published
2004-11-01
Volume
85
Issue
18
Pages
4073-4075
ISSN
  • 0003-6951 (ISSN-L)
  • 1077-3118
DOI
10.1063/1.1812580
OpenAlex
W2040083498
Cited by
747
References
0
FWCI
38.91
Type
journal article
Language
en
Open access
green

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CoChat. (2026). Citation check: Hysteretic current–voltage characteristics and resistance switching at a rectifying Ti∕Pr0.7Ca0.3MnO3 interface. https://app.cochat.ai/papers/10.1063/1.1812580
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Sawa, A., Fujii, T., Kawasaki, M., & Tokura, Y. (2004). Hysteretic current–voltage characteristics and resistance switching at a rectifying Ti∕Pr0.7Ca0.3MnO3 interface. Applied Physics Letters. https://doi.org/10.1063/1.1812580

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