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Cited by 294

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Deep-level emissions influenced by O and Zn implantations in ZnO

Zhao, Q. X., Klason, P., Willander, M., Zhong, H. M., Lu, W., Yang, J. H.·2005·Applied Physics Letters

Abstract

A set of bulk ZnO samples implanted with O and Zn at various densities were investigated by photoluminescence. The implantation concentration of O and Zn is varied between 1×1017∕cm3 and 5×1019∕cm3. The samples were thermally treated in an oxygen gas environment after the implantation. The results clearly show the influence of O and Zn implantations on the deep-level emission. By comparing the photoluminescence spectra for the samples with different implantations, we can conclude that the VZn is responsible to the observed deep-level emission. In addition, a novel transition at the emission energy of 3.08eV at 77K appears in the O-implanted sample with 5×1019∕cm3 implantation concentration. The novel emission is tentatively identified as O-antisite OZn.

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Metadata

Authors
Zhao, Q. X., Klason, P., Willander, M., Zhong, H. M., Lu, W., & Yang, J. H.
Venue
Applied Physics Letters
Published
2005-11-17
Volume
87
Issue
21
ISSN
  • 0003-6951 (ISSN-L)
  • 1077-3118
OpenAlex
W1970085422
Cited by
294
References
1
FWCI
6.85
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: Deep-level emissions influenced by O and Zn implantations in ZnO. https://app.cochat.ai/papers/10.1063/1.2135880
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Zhao, Q. X., Klason, P., Willander, M., Zhong, H. M., Lu, W., & Yang, J. H. (2005). Deep-level emissions influenced by O and Zn implantations in ZnO. Applied Physics Letters. https://doi.org/10.1063/1.2135880

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