The DOI matches its Crossref record; 1 of the 1 references it cites were found in a registry or an index.
WSXM: A software for scanning probe microscopy and a tool for nanotechnology
Open accessAbstract
In this work we briefly describe the most relevant features of WSXM, a freeware scanning probe microscopy software based on MS-Windows. The article is structured in three different sections: The introduction is a perspective on the importance of software on scanning probe microscopy. The second section is devoted to describe the general structure of the application; in this section the capabilities of WSXM to read third party files are stressed. Finally, a detailed discussion of some relevant procedures of the software is carried out.
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Cites
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Metadata
- Authors
- Horcas, I., Fernández, R., Gómez-Rodríguez, J. M., Colchero, J., Gómez-Herrero, J., & Baro, A. M.
- Venue
- Review of Scientific Instruments
- Publisher
- AIP Publishing
- Published
- 2007-01-01
- Volume
- 78
- Issue
- 1
- Pages
- 013705-013705
- ISSN
- 0034-6748 (ISSN-L)
- 1089-7623
- OpenAlex
- W2047205370
- Cited by
- 7,738
- References
- 1
- FWCI
- 242.00
- Type
- journal article
- Language
- en
- Open access
- hybrid
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- Horcas, I., Fernández, R., Gómez-Rodríguez, J. M., Colchero, J., Gómez-Herrero, J., & Baro, A. M. (2007). WSXM: A software for scanning probe microscopy and a tool for nanotechnology. Review of Scientific Instruments. https://doi.org/10.1063/1.2432410
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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
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