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Cited by 867

The DOI matches its Crossref record; 1 of the 1 references it cites were found in a registry or an index.

Atom probe tomography

Open access
Kelly, Thomas F., Miller, Michael K.·2007·Review of Scientific Instruments

Abstract

The technique of atom probe tomography (APT) is reviewed with an emphasis on illustrating what is possible with the technique both now and in the future. APT delivers the highest spatial resolution (sub-0.3-nm) three-dimensional compositional information of any microscopy technique. Recently, APT has changed dramatically with new hardware configurations that greatly simplify the technique and improve the rate of data acquisition. In addition, new methods have been developed to fabricate suitable specimens from new classes of materials. Applications of APT have expanded from structural metals and alloys to thin multilayer films on planar substrates, dielectric films, semiconducting structures and devices, and ceramic materials. This trend toward a broader range of materials and applications is likely to continue.

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Crossref · 10.1063/1.2709758

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Metadata

Authors
Kelly, T. F., & Miller, M. K.
Venue
Review of Scientific Instruments
Published
2007-03-01
Volume
78
Issue
3
Pages
031101-031101
ISSN
  • 0034-6748 (ISSN-L)
  • 1089-7623
OpenAlex
W3022476158
Cited by
867
References
1
FWCI
30.17
Type
journal article
Language
en
Open access
hybrid

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CoChat. (2026). Citation check: Atom probe tomography. https://app.cochat.ai/papers/10.1063/1.2709758
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Kelly, T. F., & Miller, M. K. (2007). Atom probe tomography. Review of Scientific Instruments. https://doi.org/10.1063/1.2709758

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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.