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Electron source concept for single-shot sub-100 fs electron diffraction in the 100 keV range
Open accessAbstract
We present a method for producing sub-100 fs electron bunches that are suitable for single-shot ultrafast electron diffraction experiments in the 100 keV energy range. A combination of analytical estimates and state-of-the-art particle tracking simulations show that it is possible to create 100 keV, 0.1 pC, 30 fs electron bunches with a spot size smaller than 500 μm and a transverse coherence length of 3 nm, using established technologies in a table-top setup. The system operates in the space-charge dominated regime to produce energy-correlated bunches that are recompressed by radio-frequency techniques. With this approach we overcome the Coulomb expansion of the bunch, providing a single-shot, ultrafast electron diffraction source concept.
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Cited by
Femtosecond electron diffraction: heralding the era of atomically resolved dynamics
Sciaini, G., & Miller, R. J. D. (2011) · Reports on Progress in Physics · doi:10.1088/0034-4885/74/9/096101 · Cited by 485
Feist, A., Bach, N., Rubiano da Silva, N., Danz, T., Möller, M., Priebe, K. E., Domröse, T., Gatzmann, J. G., Rost, S., Schauss, J., et al. (2017) · Ultramicroscopy · doi:10.1016/j.ultramic.2016.12.005 · Cited by 425
van Oudheusden, T., Pasmans, P. L. E. M., van der Geer, S. B., de Loos, M. J., van der Wiel, M. J., & Luiten, O. J. (2010) · Physical Review Letters · doi:10.1103/physrevlett.105.264801 · Cited by 340
Self-citationFemtosecond Crystallography with Ultrabright Electrons and X-rays: Capturing Chemistry in Action
Miller, R. J. D. (2014) · Science · doi:10.1126/science.1248488 · Cited by 316
Segmented terahertz electron accelerator and manipulator (STEAM)
Zhang, D., Fallahi, A., Hemmer, M., Wu, X., Fakhari, M., Hua, Y., Cankaya, H., Calendron, A.-L., Zapata, L. E., Matlis, N. H., et al. (2018) · Nature Photonics · doi:10.1038/s41566-018-0138-z · Cited by 316
Metadata
- Authors
- van Oudheusden, T., de Jong, E. F., van der Geer, S. B., ’t Root, W. P. E. M. O., Luiten, O. J., & Siwick, B. J.
- Venue
- Journal of Applied Physics
- Publisher
- AIP Publishing
- Published
- 2007-11-01
- Volume
- 102
- Issue
- 9
- ISSN
- 0021-8979 (ISSN-L)
- 1089-7550
- OpenAlex
- W2091698738
- Cited by
- 228
- References
- 0
- FWCI
- 8.82
- Type
- journal article
- Language
- en
- Open access
- bronze
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- van Oudheusden, T., de Jong, E. F., van der Geer, S. B., ’t Root, W. P. E. M. O., Luiten, O. J., & Siwick, B. J. (2007). Electron source concept for single-shot sub-100 fs electron diffraction in the 100 keV range. Journal of Applied Physics. https://doi.org/10.1063/1.2801027
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