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Cited by 274

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Microwave dielectric loss at single photon energies and millikelvin temperatures

Open access
O’Connell, Aaron D., Ansmann, M., Bialczak, R. C., Hofheinz, M., Katz, N., Lucero, Erik, McKenney, C., Neeley, M., Wang, H., Weig, E. M., Cleland, A. N., Martinis, J. M.·2008·Applied Physics Letters

Abstract

The microwave performance of amorphous dielectric materials at very low temperatures and very low excitation strengths displays significant excess loss. Here, we present the loss tangents of some common amorphous and crystalline dielectrics, measured at low temperatures (T<100mK) with near single-photon excitation energies, E∕ℏω0∼1, using both coplanar waveguide and lumped LC resonators. The loss can be understood using a two-level state defect model. A circuit analysis of the half-wavelength resonators we used is outlined, and the energy dissipation of such a resonator on a multilayered dielectric substrate is theoretically considered.

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Crossref · 10.1063/1.2898887

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Metadata

Authors
O’Connell, A. D., Ansmann, M., Bialczak, R. C., Hofheinz, M., Katz, N., Lucero, E., McKenney, C., Neeley, M., Wang, H., Weig, E. M., Cleland, A. N., & Martinis, J. M.
Venue
Applied Physics Letters
Published
2008-03-17
Volume
92
Issue
11
ISSN
  • 0003-6951 (ISSN-L)
  • 1077-3118
OpenAlex
W2071236786
Cited by
274
References
1
FWCI
15.84
Type
journal article
Language
en
Open access
green

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CoChat. (2026). Citation check: Microwave dielectric loss at single photon energies and millikelvin temperatures. https://app.cochat.ai/papers/10.1063/1.2898887
The paper
O’Connell, A. D., Ansmann, M., Bialczak, R. C., Hofheinz, M., Katz, N., Lucero, E., McKenney, C., Neeley, M., Wang, H., Weig, E. M., Cleland, A. N., & Martinis, J. M. (2008). Microwave dielectric loss at single photon energies and millikelvin temperatures. Applied Physics Letters. https://doi.org/10.1063/1.2898887

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