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Cited by 210

The DOI matches its Crossref record; 2 of the 2 references it cites were found in a registry or an index.

Atomic force microscope local oxidation nanolithography of graphene

Open access
Weng, Lishan, Zhang, Liyuan, Chen, Yong P., Rokhinson, L. P.·2008·Applied Physics Letters

Abstract

We demonstrate the local oxidation nanopatterning of graphene films by an atomic force microscope. The technique provides a method to form insulating trenches in graphene flakes and to fabricate nanodevices with sub-nanometer precision. We demonstrate fabrication of a 25-nm-wide nanoribbon and submicron size nanoring from a graphene flake. We also found that we can write either trenches or bumps on the graphene surface depending on the lithography conditions. We attribute the bumps to partial oxidation of the surface and incorporation of oxygen into the graphene lattice.

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Metadata

Authors
Weng, L., Zhang, L., Chen, Y. P., & Rokhinson, L. P.
Venue
Applied Physics Letters
Published
2008-09-01
Volume
93
Issue
9
ISSN
  • 0003-6951 (ISSN-L)
  • 1077-3118
OpenAlex
W1554537324
Cited by
210
References
2
FWCI
8.93
Type
journal article
Language
en
Open access
green

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CoChat. (2026). Citation check: Atomic force microscope local oxidation nanolithography of graphene. https://app.cochat.ai/papers/10.1063/1.2976429
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Weng, L., Zhang, L., Chen, Y. P., & Rokhinson, L. P. (2008). Atomic force microscope local oxidation nanolithography of graphene. Applied Physics Letters. https://doi.org/10.1063/1.2976429

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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.