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Cited by 473

The DOI matches its Crossref record; 23 of the 23 references it cites were found in a registry or an index.

Exciton diffusion lengths of organic semiconductor thin films measured by spectrally resolved photoluminescence quenching

Lunt, Richard R., Giebink, Noel C., Belak, Anna A., Benziger, Jay B., Forrest, Stephen R.·2009·Journal of Applied Physics

Abstract

We demonstrate spectrally resolved photoluminescence quenching as a means to determine the exciton diffusion length of several archetype organic semiconductors used in thin film devices. We show that aggregation and crystal orientation influence the anisotropy of the diffusion length for vacuum-deposited polycrystalline films. The measurement of the singlet diffusion lengths is found to be in agreement with diffusion by Förster transfer, whereas triplet diffusion occurs primarily via Dexter transfer.

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Metadata

Authors
Lunt, R. R., Giebink, N. C., Belak, A. A., Benziger, J. B., & Forrest, S. R.
Venue
Journal of Applied Physics
Published
2009-03-01
Volume
105
Issue
5
ISSN
  • 0021-8979 (ISSN-L)
  • 1089-7550
OpenAlex
W1982391368
Cited by
473
References
23
FWCI
24.82
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: Exciton diffusion lengths of organic semiconductor thin films measured by spectrally resolved photoluminescence quenching. https://app.cochat.ai/papers/10.1063/1.3079797
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Lunt, R. R., Giebink, N. C., Belak, A. A., Benziger, J. B., & Forrest, S. R. (2009). Exciton diffusion lengths of organic semiconductor thin films measured by spectrally resolved photoluminescence quenching. Journal of Applied Physics. https://doi.org/10.1063/1.3079797

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