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Optical identification of atomically thin dichalcogenide crystals
Open accessAbstract
We present a systematic study of the optical contrast of niobium diselenide and molybdenum disulfide flakes deposited onto silicon wafers with a thermally grown silicon oxide layer. We measure the optical contrast of flakes whose thickness, which is obtained by atomic force microscopy, ranges from 200 layers down to a monolayer using different illumination wavelengths in the visible spectrum. The refractive index of these thin crystals has been obtained from the optical contrast using Fresnel law. In this way the optical microscopy data can be quantitatively analyzed to determine the thickness of the flakes in a fast and nondestructive way.
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Two-dimensional atomic crystals
Novoselov, K. S., Jiang, D., Schedin, F., Booth, T. J., Khotkevich, V. V., Morozov, S. V., & Geim, A. K. (2005) · Proceedings of the National Academy of Sciences · doi:10.1073/pnas.0502848102 · Cited by 11,788
Cited by
Second harmonic microscopy of monolayer MoS2
Kumar, N., Najmaei, S., Cui, Q., Ceballos, F., Ajayan, P. M., Lou, J., & Zhao, H. (2013) · Physical Review B · doi:10.1103/physrevb.87.161403 · Cited by 699
Nonblinking, Intense Two-Dimensional Light Emitter: Monolayer WS2 Triangles
Peimyoo, N., Shang, J., Cong, C., Shen, X., Wu, X., Yeow, E. K. L., & Yu, T. (2013) · ACS Nano · doi:10.1021/nn4046002 · Cited by 308
Chakravarty, D., & Late, D. J. (2015) · RSC Advances · doi:10.1039/c4ra12599a · Cited by 98
Metadata
- Authors
- Castellanos-Gomez, A., Agraït, N., & Rubio-Bollinger, G.
- Venue
- Applied Physics Letters
- Publisher
- AIP Publishing
- Published
- 2010-05-24
- Volume
- 96
- Issue
- 21
- ISSN
- 0003-6951 (ISSN-L)
- 1077-3118
- OpenAlex
- W1993173612
- Cited by
- 326
- References
- 1
- FWCI
- 7.57
- Type
- journal article
- Language
- en
- Open access
- green
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