The DOI matches its Crossref record.
Patterning of silicon surfaces with noncontact atomic force microscopy: Field-induced formation of nanometer-size water bridges
Open accessAbstract
Nanometer-size water bridges have been used to confine the oxidation of silicon surfaces with a noncontact atomic force microscope. The formation of a water bridge between two surfaces separated by a gap of a few nanometers is driven by the application of an electrical field. Once a liquid bridge is formed, its length and neck diameter can be modified by changing the tip-sample separation. The liquid bridge provides the ionic species and the spatial confinement to pattern Si(100) surfaces in noncontact force microscopy. The method is applied to write arrays of several thousands dots with a periodicity of 40 nm and an average width of 10 nm.
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cited by
Molecular Structure of Water at Interfaces: Wetting at the Nanometer Scale
Verdaguer, A., Sacha, G. M., Bluhm, H., & Salmeron, M. (2006) · Chemical Reviews · doi:10.1021/cr040376l · Cited by 627
Nano-chemistry and scanning probe nanolithographies
Garcia, R., Martinez, R. V., & Martinez, J. (2006) · Chem. Soc. Rev. · doi:10.1039/b501599p · Cited by 375
Metadata
- Authors
- Garcı́a, R., Calleja, M., & Rohrer, H.
- Venue
- Journal of Applied Physics
- Publisher
- AIP Publishing
- Published
- 1999-08-15
- Volume
- 86
- Issue
- 4
- Pages
- 1898-1903
- ISSN
- 0021-8979 (ISSN-L)
- 1089-7550
- OpenAlex
- W2084742543
- Cited by
- 208
- References
- 0
- FWCI
- 6.06
- Type
- journal article
- Language
- en
- Open access
- bronze
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: Patterning of silicon surfaces with noncontact atomic force microscopy: Field-induced formation of nanometer-size water bridges. https://app.cochat.ai/papers/10.1063/1.370985
- The paper
- Garcı́a, R., Calleja, M., & Rohrer, H. (1999). Patterning of silicon surfaces with noncontact atomic force microscopy: Field-induced formation of nanometer-size water bridges. Journal of Applied Physics. https://doi.org/10.1063/1.370985
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
