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Cited by 304

The DOI matches its Crossref record; 2 of the 2 references it cites were found in a registry or an index.

Investigation of the optical properties of MoS2 thin films using spectroscopic ellipsometry

Yim, Chanyoung, O'Brien, Maria, McEvoy, Niall, Winters, Sinéad, Mirza, Inam, Lunney, James G., Duesberg, Georg S.·2014·Applied Physics Letters

Abstract

Views Icon Views Article contents Figures & tables Video Audio Supplementary Data Peer Review Share Icon Share Twitter Facebook Reddit LinkedIn Tools Icon Tools Reprints and Permissions Cite Icon Cite Search Site Citation Chanyoung Yim, Maria O'Brien, Niall McEvoy, Sinéad Winters, Inam Mirza, James G. Lunney, Georg S. Duesberg; Investigation of the optical properties of MoS2 thin films using spectroscopic ellipsometry. Appl. Phys. Lett. 10 March 2014; 104 (10): 103114. https://doi.org/10.1063/1.4868108 Download citation file: Ris (Zotero) Reference Manager EasyBib Bookends Mendeley Papers EndNote RefWorks BibTex toolbar search Search Dropdown Menu toolbar search search input Search input auto suggest filter your search All ContentAIP Publishing PortfolioApplied Physics Letters Search Advanced Search |Citation Search

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Metadata

Authors
Yim, C., O'Brien, M., McEvoy, N., Winters, S., Mirza, I., Lunney, J. G., & Duesberg, G. S.
Venue
Applied Physics Letters
Published
2014-03-10
Volume
104
Issue
10
Pages
103114
ISSN
  • 0003-6951 (ISSN-L)
  • 1077-3118
OpenAlex
W2032786279
Cited by
304
References
2
FWCI
13.55
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: Investigation of the optical properties of MoS2 thin films using spectroscopic ellipsometry. https://app.cochat.ai/papers/10.1063/1.4868108
The paper
Yim, C., O'Brien, M., McEvoy, N., Winters, S., Mirza, I., Lunney, J. G., & Duesberg, G. S. (2014). Investigation of the optical properties of MoS2 thin films using spectroscopic ellipsometry. Applied Physics Letters. https://doi.org/10.1063/1.4868108

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