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1.54-μm electroluminescence of erbium-doped silicon grown by molecular beam epitaxy

Ennen, H., Pomrenke, G., Axmann, A., Eisele, K., Haydl, W., Schneider, J.·1985·Applied Physics Letters

Abstract

The feasibility of producing erbium-doped silicon light-emitting diodes by molecular beam epitaxy is demonstrated. The p-n junctions are formed by growing an erbium-doped p-type epitaxial silicon layer on an n-type silicon substrate. When the diodes are biased in the forward direction at 77 K they show an intense sharply structured electroluminescence spectrum at 1.54 μm. This luminescence is assigned to the internal 4f–4f transition 4I13/2→4I15/2 of Er3+ (4f11).

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Metadata

Authors
Ennen, H., Pomrenke, G., Axmann, A., Eisele, K., Haydl, W., & Schneider, J.
Venue
Applied Physics Letters
Published
1985-02-15
Volume
46
Issue
4
Pages
381-383
ISSN
  • 0003-6951 (ISSN-L)
  • 1077-3118
OpenAlex
W1977788464
Cited by
349
References
0
FWCI
9.16
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: 1.54-μm electroluminescence of erbium-doped silicon grown by molecular beam epitaxy. https://app.cochat.ai/papers/10.1063/1.95639
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Ennen, H., Pomrenke, G., Axmann, A., Eisele, K., Haydl, W., & Schneider, J. (1985). 1.54-μm electroluminescence of erbium-doped silicon grown by molecular beam epitaxy. Applied Physics Letters. https://doi.org/10.1063/1.95639

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