Leakage currents in porous PZT films
Abstract
Charge transport phenomena in porous ceramic PZT films are discussed. The leakage current has been found to be in PZT porous films is 1–1.5 orders higher than for the dense film throughout the whole bias voltage. In the low fields region (∼40–160 kV/cm) the main charge transport mechanism is the ohmic conductivity. Static (steady state) conductivity of porous PZT films is 1–2 orders higher than of dense film. The main possible charge transport mechanism in the high fields region (≥160–180 kV/cm) is the space-charge-limited conduction.
Integrity signals
Registry
Cites
Statistics
Claims the paper makes
Claims other papers make about this one
Each is checked against this paper’s own text: does it say what the citing paper says it does?
The porosity observed in the 50 nm sample acts as a field concentration center, and local electric field concentrations increase leakage current and provide nucleation sites for breakdown.
“The porosity observed in the 50 nm sample in TEM is expected in the 200 nm sample, which acts as a field concentration center.30 The local concentrations of the electric field increase leakage current and provide nucleation sites for breakdown.”
From The other model antiferroelectric: PbHfO3 thin films from ALD precursors (2021) · cites this paper as [30]
Cited by
Sorted by citations
The other model antiferroelectric: PbHfO3 thin films from ALD precursors
Hanrahan, B., Milesi-Brault, C., Leff, A., Payne, A., Liu, S., Guennou, M., & Strnad, N. (2021) · APL Materials · doi:10.1063/5.0035730 · Cited by 19 · see citing works
- Authors
- Podgorny, Y., Vorotilov, K., Lavrov, P., & Sigov, A.
- Affiliations
- MIREA - Russian Technological University (RU)
- Corresponding author
- Vorotilov, K.
- Venue
- Ferroelectrics
- Publisher
- Informa UK Limited
- Published
- 2016-10-20
- Volume
- 503
- Issue
- 1
- Pages
- 77-84
- ISSN
- 0015-0193 (ISSN-L)
- 1563-5112
- OpenAlex
- W2553403713
- Cited by
- 14
- References
- 0
- Citations by year
- 2025: 2 · 2024: 2 · 2023: 2 · 2022: 1 · 2021: 2 · 2020: 1 · 2019: 2 · 2018: 2
- FWCI
- 0.59
- Type
- journal article
- Language
- en
- Open access
- closed
- Locations
- Ferroelectrics (publishedVersion)
- Topics
- Physical Sciences › Materials Science › Materials Chemistry › Ferroelectric and Piezoelectric Materials
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Ferroelectric and Negative Capacitance Devices
- Physical Sciences › Materials Science › Materials Chemistry › Dielectric properties of ceramics
- Keywords
- leakage current, lead zirconate titanate, charge transport, space charge limited conduction, ohmic conductivity, DC conductivity, high electric field, ferroelectric ceramics
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review