Cited by 265Optical Polarization and EllipsometryOptical and Acousto-Optic TechnologiesElectrical and Electromagnetic Research

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Kramers-Kronig analysis of reflection data

Roessler, D M·1965·British Journal of Applied Physics

DOI 10.1088/0508-3443/16/8/310

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Abstract

A method is given for using the Kramers-Kronig dispersion relations to evaluate optical and dielectric parameters of materials from normal incidence reflectance data when data over only a limited spectral range is available. No assumptions are needed concerning the behaviour of the reflectance data outside the experimental range, and no extrapolations of data are required. As an example, the extreme ultra-violet reflectance data of potassium iodide is analysed by this method.

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Authors: Roessler, D. M.
Affiliations: University of London (GB)
Corresponding author: Roessler, D M
Venue: British Journal of Applied Physics
Publisher: IOP Publishing
Published: 1965-08
Volume: 16
Issue: 8
Pages: 1119-1123
ISSN: 0508-3443 (ISSN-L)
DOI: 10.1088/0508-3443/16/8/310
OpenAlex: W2056222652
Cited by: 264
References: 6
Citations by year: 2026: 4 · 2025: 7 · 2024: 10 · 2023: 2 · 2022: 8 · 2021: 4 · 2020: 7 · 2019: 8 · 2018: 17 · 2017: 3 · 2016: 5 · 2015: 6 · 2014: 6 · 2013: 2 · 2012: 2
FWCI: 16.24
Type: journal article
Language: en
Open access: closed
Locations: British Journal of Applied Physics (publishedVersion)
Topics: Physical Sciences › Physics and Astronomy › Atomic and Molecular Physics, and Optics › Optical Polarization and Ellipsometry
Physical Sciences › Physics and Astronomy › Atomic and Molecular Physics, and Optics › Optical and Acousto-Optic Technologies
Physical Sciences › Engineering › Electrical and Electronic Engineering › Electrical and Electromagnetic Research
Keywords: Kramers-Kronig dispersion relations, reflectance spectroscopy, optical constants, dielectric properties, normal incidence reflectance, potassium iodide

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Kramers-Kronig analysis of reflection data

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