Student or educator? Sign up with your school email and get 6 months of Pro free.
Cited by 166

The DOI matches its Crossref record; 2 of the 2 references it cites were found in a registry or an index.

Recent advances in chemical and magnetic imaging of surfaces and interfaces by XPEEM

Locatelli, A, Bauer, E·2008·Journal of Physics: Condensed Matter

Abstract

Synchrotron-based photoemission electron microscopy (XPEEM) is one of the most powerful spectro-microscopic techniques for the investigation of surfaces, interfaces, thin films and buried layers. By exploiting the tunability and polarizability of x-ray sources as well as progress in electron optics design, modern XPEEM instruments can perform several x-ray spectroscopic investigations with a lateral resolution of a few tens of nanometres. We review here the latest developments in XPEEM, illustrating the state of the art capabilities of the technique. The usefulness of chemical and magnetic imaging XPEEM methods is demonstrated by examples of fundamental and applied studies in surface and material sciences, as well as other fields of application ranging from magnetism to biology and geology.

Overview

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Integrity signals

Registry

Crossref · 10.1088/0953-8984/20/9/093002

Cites

2 of 2 references verified0 citation errors · 0 not checkable

Statistics

Verification

Claims the paper makes

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Self-check

Percentages, sums and reported differences re-computed from the paper’s own numbers.

The self-check needs the paper’s full text.

Citations

Cites

Show all 2 references

Cited by

See all 166

Metadata

Authors
Locatelli, A., & Bauer, E.
Venue
Journal of Physics: Condensed Matter
Published
2008-02-15
Volume
20
Issue
9
Pages
093002
ISSN
  • 0953-8984 (ISSN-L)
  • 1361-648X
OpenAlex
W2032571428
Cited by
166
References
2
FWCI
4.94
Type
journal article
Language
en
Open access
closed

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

What counts as a claim ›How we measure confidence ›How we check this ›

Are you an author, or do you see a problem with this page? Request a review

How to cite

Cite CoChat for the checks on this page, and the paper for its own findings.

This page
CoChat. (2026). Citation check: Recent advances in chemical and magnetic imaging of surfaces and interfaces by XPEEM. https://app.cochat.ai/papers/10.1088/0953-8984/20/9/093002
The paper
Locatelli, A., & Bauer, E. (2008). Recent advances in chemical and magnetic imaging of surfaces and interfaces by XPEEM. Journal of Physics: Condensed Matter. https://doi.org/10.1088/0953-8984/20/9/093002

Data sources

Bibliographic data: Semantic Scholar, OpenAlex, Crossref.

Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.