The DOI matches its Crossref record; 3 of the 3 references it cites were found in a registry or an index.
The influence of defects on the Ni 2p and O 1s XPS of NiO
Open accessAbstract
The Ni 2p and O 1s XPS of NiO single crystals were measured using monochromatic Al K alpha radiation. Different treatments of the crystals allow the authors to give a description of the influence of defects on these spectra. The Ni 2p 3/2 spectrum of in-situ-cleaved NiO exhibits clearly visible features at 854.1 ev 855.6 eV and 861 eV. The intensity ratio changes after ion bombardment and an additional peak at 852.2 eV appears. Apart from a slight increase in linewidth the O 1s spectrum remains unchanged. The O 1s spectrum from an in-situ-cleaved NiO single crystal exhibits only a single peak at 529.4 eV which can be fitted by a Gaussian line profile. Further measurements allow the authors to attribute the well known O 1s satellite at 531.2 eV to emission from oxygen-containing species adsorbed at defects.
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Cites
Kim, K. S., & Winograd, N. (1974) · Surface Science · doi:10.1016/0039-6028(74)90281-7 · Cited by 831
Compositional changes induced by 3.5 keV Ar+ ion bombardment in Ni-Ti oxide systems
González-Elipe, A. R., Munuera, G., Espinós, J. P., & Sanz, J. M. (1989) · Surface Science · doi:10.1016/0039-6028(89)90239-2 · Cited by 114
X-ray photoelectron spectra of defective nickel oxide
Tomellini, M. (1988) · Journal of the Chemical Society Faraday Transactions 1 Physical Chemistry in Condensed Phases · doi:10.1039/f19888403501 · Cited by 88
Cited by
Xu, Y., Gao, M., Zheng, Y., Jiang, J., & Yu, S. (2013) · Angewandte Chemie International Edition · doi:10.1002/anie.201303495 · Cited by 403
Rahmanifar, M. S., Hesari, H., Noori, A., Masoomi, M. Y., Morsali, A., & Mousavi, M. F. (2018) · Electrochimica Acta · doi:10.1016/j.electacta.2018.04.130 · Cited by 389
Tian, Y., Wang, S., Velasco, E., Yang, Y., Cao, L., Zhang, L., Li, X., Lin, Y., Zhang, Q., & Chen, L. (2020) · iScience · doi:10.1016/j.isci.2019.100756 · Cited by 246
Metadata
- Authors
- Uhlenbrock, S., Scharfschwerdt, C., Neumann, M., Illing, G., & Freund, H. J.
- Venue
- Journal of Physics: Condensed Matter
- Publisher
- IOP Publishing
- Published
- 1992-10-05
- Volume
- 4
- Issue
- 40
- Pages
- 7973-7978
- ISSN
- 0953-8984 (ISSN-L)
- OpenAlex
- W2050017442
- Cited by
- 320
- References
- 3
- FWCI
- 3.10
- Type
- journal article
- Language
- en
- Open access
- bronze
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- Uhlenbrock, S., Scharfschwerdt, C., Neumann, M., Illing, G., & Freund, H. J. (1992). The influence of defects on the Ni 2p and O 1s XPS of NiO. Journal of Physics: Condensed Matter. https://doi.org/10.1088/0953-8984/4/40/009
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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
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