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Cited by 174

The DOI matches its Crossref record; 3 of the 3 references it cites were found in a registry or an index.

Morphology of graphene thin film growth on SiC(0001)

Open access
Ohta, Taisuke, El Gabaly, Farid, Bostwick, Aaron, McChesney, Jessica L, Emtsev, Konstantin V, Schmid, Andreas K, Seyller, Thomas, Horn, Karsten, Rotenberg, Eli·2008·New Journal of Physics

Abstract

Epitaxial films of graphene on SiC(0001) are interesting from a basic physics as well as an applications-oriented point of view. Here, we study the emerging morphology of in vacuo prepared graphene films using low-energy electron microscopy (LEEM) and angle-resolved photoemission spectroscopy (ARPES). We obtain an identification of single-layer and bilayer graphene films by comparing the characteristic features in electron reflectivity spectra in LEEM to the π-band structure as revealed by ARPES. We demonstrate that LEEM serves as a tool to accurately determine the local extent of graphene layers as well as the layer thickness.

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Crossref · 10.1088/1367-2630/10/2/023034

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Metadata

Authors
Ohta, T., El Gabaly, F., Bostwick, A., McChesney, J. L., Emtsev, K. V., Schmid, A. K., Seyller, T., Horn, K., & Rotenberg, E.
Venue
New Journal of Physics
Published
2008-02-21
Volume
10
Issue
2
Pages
023034
ISSN
1367-2630 (ISSN-L)
OpenAlex
W1992970469
Cited by
174
References
3
FWCI
13.14
Type
journal article
Language
en
Open access
gold

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CoChat. (2026). Citation check: Morphology of graphene thin film growth on SiC(0001). https://app.cochat.ai/papers/10.1088/1367-2630/10/2/023034
The paper
Ohta, T., El Gabaly, F., Bostwick, A., McChesney, J. L., Emtsev, K. V., Schmid, A. K., Seyller, T., Horn, K., & Rotenberg, E. (2008). Morphology of graphene thin film growth on SiC(0001). New Journal of Physics. https://doi.org/10.1088/1367-2630/10/2/023034

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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

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