Cited by 22Quantum Information and CryptographyCold Atom Physics and Bose-Einstein CondensatesQuantum Computing Algorithms and Architecture

Design, fabrication and characterization of a micro-fabricated stacked-wafer segmented ion trap with two X-junctions

Open access
Decaroli, Chiara, Matt, Roland, Oswald, Robin, Axline, Christopher, Ernzer, Maryse, Flannery, Jeremy, Ragg, Simon, Home, Jonathan P·2021·Quantum Science and Technology

Abstract

We describe the implementation of a three-dimensional Paul ion trap fabricated from a stack of precision-machined silica glass wafers, which incorporates a pair of junctions for two-dimensional ion transport. The trap has 142 dedicated electrodes which can be used to define multiple potential wells in which strings of ions can be held. By supplying time-varying potentials, this also allows for transport and re-configuration of ion strings. We describe the design, simulation, fabrication and packaging of the trap, including explorations of different parameter regimes and possible optimizations and design choices. We give results of initial testing of the trap, including measurements of heating rates and junction transport.

Integrity signals

Registry

Crossref · 10.1088/2058-9565/ac07ee

Cites

5 of 5 references verified0 citation errors · 0 not checkable

Statistics

Recomputing p-values needs the paper’s full text.

Claims the paper makes

We couldn’t retrieve this paper’s full text, so its claims and self-check weren’t run. The registry and citation checks still apply.

Claims other papers make about this one

Each is checked against this paper’s own text: does it say what the citing paper says it does?

  • Helios uses a four-way 'X' junction to connect memory regions to quantum logic regions without increasing electrical control or device fabrication complexity.

    “Second, Helios uses a four-way ‘X’ junction10,11,29–35 to connect memory regions to quantum logic regions without increasing electrical control or device fabrication complexity.”

Cites

Flagged first, then by citations

Cited by

Sorted by citations

Authors
Decaroli, C., Matt, R., Oswald, R., Axline, C., Ernzer, M., Flannery, J., Ragg, S., & Home, J. P.
Affiliations
ETH Zurich (CH)
Corresponding author
Decaroli, Chiara
Venue
Quantum Science and Technology
Published
2021-07-07
Volume
6
Issue
4
Pages
044001
ISSN
2058-9565 (ISSN-L)
OpenAlex
W3171647381
Cited by
22
References
5
Citations by year
2026: 5 · 2025: 2 · 2024: 3 · 2023: 7 · 2022: 5
FWCI
1.33
Type
journal article
Language
en
Open access
Locations
  • Quantum Science and Technology (publishedVersion, cc-by)
  • Repository for Publications and Research Data (ETH Zurich) (submittedVersion, cc-by)
  • ETH Zürich Research Collection (cc-by)
Funders
  • Swiss National Fund (200020_165555 and 200020_179147)
  • AQTION Quantum Flagship (820495)
  • Intelligence Advanced Research Projects Activity (W911NF-16-1-0070)
Topics
  • Physical Sciences › Computer Science › Artificial Intelligence › Quantum Information and Cryptography
  • Physical Sciences › Physics and Astronomy › Atomic and Molecular Physics, and Optics › Cold Atom Physics and Bose-Einstein Condensates
  • Physical Sciences › Computer Science › Artificial Intelligence › Quantum Computing Algorithms and Architecture
Keywords
Paul trap, X-junctions, potential well, time-dependent potential, heating rate

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

What counts as a claim ›How we measure confidence ›How we check this ›

Are you an author, or do you see a problem with this page? Request a review