The DOI matches its Crossref record.
STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV cold field emission gun
Abstract
A spherical aberration-corrected electron microscope has been developed recently, which is equipped with a 300-kV cold field emission gun and an objective lens of a small chromatic aberration coefficient. A dumbbell image of 47 pm spacing, corresponding to a pair of atomic columns of germanium aligned along the [114] direction, is resolved in high-angle annular dark field (HAADF) scanning transmission electron microscopy (STEM) with a 0.4-eV energy spread of the electron beam. The observed image was compared with a simulated image obtained by dynamical calculation.
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cited by
Electron ptychography of 2D materials to deep sub-ångström resolution
Jiang, Y., Chen, Z., Han, Y., Deb, P., Gao, H., Xie, S., Purohit, P., Tate, M. W., Park, J., Gruner, S. M., et al. (2018) · Nature · doi:10.1038/s41586-018-0298-5 · Cited by 664
Theory and applications of free-electron vortex states
Bliokh, K. Y., Ivanov, I. P., Guzzinati, G., Clark, L., Van Boxem, R., Béché, A., Juchtmans, R., Alonso, M. A., Schattschneider, P., Nori, F., et al. (2017) · Physics Reports · doi:10.1016/j.physrep.2017.05.006 · Cited by 366
Nam, K. W., Kim, H., Choi, J. H., & Choi, J. W. (2019) · Energy & Environmental Science · doi:10.1039/c9ee00718k · Cited by 353
Ke, X., Bittencourt, C., & Van Tendeloo, G. (2015) · Beilstein Journal of Nanotechnology · doi:10.3762/bjnano.6.158 · Cited by 45
Metadata
- Authors
- Sawada, H., Tanishiro, Y., Ohashi, N., Tomita, T., Hosokawa, F., Kaneyama, T., Kondo, Y., & Takayanagi, K.
- Venue
- Journal of Electron Microscopy
- Publisher
- Oxford University Press (OUP)
- Published
- 2009-06-22
- Volume
- 58
- Issue
- 6
- Pages
- 357-361
- ISSN
- 0022-0744 (ISSN-L)
- 1477-9986
- OpenAlex
- W2161603942
- Cited by
- 170
- References
- 0
- FWCI
- 9.19
- Type
- journal article
- Language
- en
- Open access
- closed
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV cold field emission gun. https://app.cochat.ai/papers/10.1093/jmicro/dfp030
- The paper
- Sawada, H., Tanishiro, Y., Ohashi, N., Tomita, T., Hosokawa, F., Kaneyama, T., Kondo, Y., & Takayanagi, K. (2009). STEM imaging of 47-pm-separated atomic columns by a spherical aberration-corrected electron microscope with a 300-kV cold field emission gun. Journal of Electron Microscopy. https://doi.org/10.1093/jmicro/dfp030
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
