The DOI matches its Crossref record.
Growth and structure of ultrathin FeO films on Pt(111) studied by STM and LEED
Open accessAbstract
The growth of iron-oxide films on Pt(111) prepared by iron deposition and subsequent oxidation was studied by scanning tunneling microscopy (STM) and high-resolution low-energy electron diffraction (LEED). Despite a 10% lattice mismatch to the substrate, an epitaxial growth of well-ordered films is observed. The oxide starts to grow layer by layer in a (111) orientation of the metastable cubic FeO structure up to a thickness of about 2.2 monolayers (ML). The completion of the second and third FeO layer depends on the precise oxidation temperature, and at coverages of approximately 2 ML three-dimensional ${\mathrm{Fe}}_{3}{\mathrm{O}}_{4}(111)$ islands start to grow. The FeO(111) layers consist of hexagonal close-packed iron-oxygen bilayers that are laterally expanded when compared to bulk FeO and slightly rotated against the platinum substrate. They all exhibit oxygen-terminated unreconstructed $(1\ifmmode\times\else\texttimes\fi{}1)$ surface structures. With increasing coverage several structural film changes occur, and four coincidence structures with slightly different lateral lattice constants and rotation misfit angles against the platinum substrate are formed. In the submonolayer regime an FeO(111) bilayer with a lattice constant of 3.11 \AA{} and rotated by 1.3\ifmmode^\circ\else\textdegree\fi{} against the platinum substrate is observed. Upon completion of the first layer the film gets compressed leading to a lattice constant of 3.09 \AA{} and a rotation misfit angle of 0.6\ifmmode^\circ\else\textdegree\fi{}. Between 1.5 and 2 ML a coincidence structure rotated by 30\ifmmode^\circ\else\textdegree\fi{} against the platinum substrate forms, and at 2 ML a nonrotated coincidence structure with a lattice constant of 3.15 \AA{} evolves. All these coincidence structures exhibit large periodicities between approximately 22 and 38 \AA{} that are visible in the STM images up to the third FeO layer surface. The LEED patterns exhibit characteristic multiple scattering satellite spots. The different coincidence structures reflect lowest-total-energy arrangements, balancing the contributions of substrate-overlayer interface energies and elastic energies within the strained oxide overlayer for each coverage.
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cited by
Electronic and Structural Properties of Thin Iron Oxide Films on CeO2
Piliai, L., Castro-Latorre, P., Pchálek, F., Oveysipoor, S., Kosto, Y., Khalakhan, I., Skála, T., Neyman, K. M., Alemany, P., Vorochta, M., et al. (2024) · ACS Applied Materials & Interfaces · doi:10.1021/acsami.4c05542 · Cited by 8
Metadata
- Authors
- Ritter, M., Ranke, W., & Weiss, W.
- Venue
- Physical Review B
- Publisher
- American Physical Society (APS)
- Published
- 1998-03-15
- Volume
- 57
- Issue
- 12
- Pages
- 7240-7251
- ISSN
- 0163-1829 (ISSN-L)
- 1095-3795
- OpenAlex
- W2034754777
- Cited by
- 229
- References
- 0
- FWCI
- 7.36
- Type
- journal article
- Language
- en
- Open access
- bronze
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: Growth and structure of ultrathin FeO films on Pt(111) studied by STM and LEED. https://app.cochat.ai/papers/10.1103/physrevb.57.7240
- The paper
- Ritter, M., Ranke, W., & Weiss, W. (1998). Growth and structure of ultrathin FeO films on Pt(111) studied by STM and LEED. Physical Review B. https://doi.org/10.1103/physrevb.57.7240
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.