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Cited by 240

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Structure stability and carrier localization inCdX(X=S,Se,Te)semiconductors

Wei, Su-Huai, Zhang, S. B.·2000·Physical Review B

Abstract

We studied systematically the structural and electronic properties of binary $\mathrm{Cd}X$ $(X=\mathrm{S},$ Se, and Te) semiconductors in both zinc-blende (ZB) and wurtzite (WZ) structures, the band alignment on the ZB/WZ interfaces, and carrier localization induced by the band offsets. We show, by first-principles band-structure calculation that at low temperature, CdS is stable in the wurtzite structure, while CdSe and CdTe are stable in the zinc-blende structure. However, coherent substrate strain can change CdTe to be more stable in the wurtzite form. We find that $\mathrm{Cd}X$ in the wurtzite structure has a larger band gap than the one in the zinc-blende structure. The band alignment on the ZB/WZ interface is found to be type II with holes localized on the wurtzite side and electrons on the zinc-blende side.

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Crossref · 10.1103/physrevb.62.6944

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Metadata

Authors
Wei, S.-H., & Zhang, S. B.
Venue
Physical Review B
Published
2000-09-15
Volume
62
Issue
11
Pages
6944-6947
ISSN
  • 0163-1829 (ISSN-L)
  • 1095-3795
OpenAlex
W2073297788
Cited by
240
References
1
FWCI
0.47
Type
journal article
Language
en
Open access
closed

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