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Cited by 628

The DOI matches its Crossref record; 2 of the 2 references it cites were found in a registry or an index.

Structural and electronic properties of h-BN

Liu, Lei, Feng, Y. P., Shen, Z. X.·2003·Physical Review B

Abstract

Effects of stacking behavior of hexagonal basal layers to the structural stability and electronic properties of h-BN were investigated thoroughly using first-principles calculations based on the density-functional theory local-density approximation. Three of five possible h-BN structures with ``good'' stacking were found to be stable or substable. Considering that intrinsic stacking fault exist in real h-BN crystals which results in mixed stacking behavior, the experimentally observed large interlayer spacing of structures with stacking disorder such as PBN and t-BN can be understood. A substable structure with a direct band gap of about 3.395 eV was predicted. The existence of this substable structure and related intrinsic stacking fault in real h-BN explains the discrepancy in the nature of the band gap and the large variation in the observed band-gap values of h-BN.

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Metadata

Authors
Liu, L., Feng, Y. P., & Shen, Z. X.
Venue
Physical Review B
Published
2003-09-02
Volume
68
Issue
10
ISSN
  • 0163-1829 (ISSN-L)
  • 1095-3795
OpenAlex
W2328241741
Cited by
628
References
2
FWCI
3.81
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: Structural and electronic properties of h-BN. https://app.cochat.ai/papers/10.1103/physrevb.68.104102
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Liu, L., Feng, Y. P., & Shen, Z. X. (2003). Structural and electronic properties of h-BN. Physical Review B. https://doi.org/10.1103/physrevb.68.104102

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