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Cited by 219

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Near-Edge X-Ray Absorption Fine-Structure Investigation of Graphene

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Pacilé, D., Papagno, M., Rodríguez, A. Fraile, Grioni, M., Papagno, L., Girit, Ç. Ö., Meyer, J. C., Begtrup, G. E., Zettl, A.·2008·Physical Review Letters

Abstract

We report the near-edge x-ray absorption fine-structure (NEXAFS) spectrum of a single layer of graphite (graphene) obtained by micromechanical cleavage of highly ordered pyrolytic graphite on a SiO2 substrate. We utilized a photoemission electron microscope to separately study single-, double-, and few-layers graphene samples. In single-layer graphene we observe a splitting of the pi resonance and a clear signature of the predicted interlayer state. The NEXAFS data illustrate the rapid evolution of the electronic structure with the increased number of layers.

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Crossref · 10.1103/physrevlett.101.066806

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Metadata

Authors
Pacilé, D., Papagno, M., Rodríguez, A. F., Grioni, M., Papagno, L., Girit, Ç. Ö., Meyer, J. C., Begtrup, G. E., & Zettl, A.
Venue
Physical Review Letters
Published
2008-08-08
Volume
101
Issue
6
Pages
066806-066806
ISSN
  • 0031-9007 (ISSN-L)
  • 1079-7114
OpenAlex
W1966593588
Cited by
219
References
1
FWCI
5.89
Type
journal article
Language
en
Open access
bronze

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CoChat. (2026). Citation check: Near-Edge X-Ray Absorption Fine-Structure Investigation of Graphene. https://app.cochat.ai/papers/10.1103/physrevlett.101.066806
The paper
Pacilé, D., Papagno, M., Rodríguez, A. F., Grioni, M., Papagno, L., Girit, Ç. Ö., Meyer, J. C., Begtrup, G. E., & Zettl, A. (2008). Near-Edge X-Ray Absorption Fine-Structure Investigation of Graphene. Physical Review Letters. https://doi.org/10.1103/physrevlett.101.066806

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