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Cited by 369

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Intrinsic and extrinsic corrugation of monolayer graphene deposited onSiO2

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Geringer, V., Liebmann, M., Echtermeyer, T., Runte, S., Schmidt, M., Rückamp, R., Lemme, M. C., Morgenstern, M.·2009·Physical Review Letters

Abstract

Using scanning tunneling microscopy in an ultrahigh vacuum and atomic force microscopy, we investigate the corrugation of graphene flakes deposited by exfoliation on a Si/SiO2 (300 nm) surface. While the corrugation on SiO2 is long range with a correlation length of about 25 nm, some of the graphene monolayers exhibit an additional corrugation with a preferential wavelength of about 15 nm. A detailed analysis shows that the long-range corrugation of the substrate is also visible on graphene, but with a reduced amplitude, leading to the conclusion that the graphene is partly freely suspended between hills of the substrate. Thus, the intrinsic rippling observed previously on artificially suspended graphene can exist as well, if graphene is deposited on SiO2.

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Metadata

Authors
Geringer, V., Liebmann, M., Echtermeyer, T., Runte, S., Schmidt, M., Rückamp, R., Lemme, M. C., & Morgenstern, M.
Venue
Physical Review Letters
Published
2009-02-17
Volume
102
Issue
7
Pages
076102-076102
ISSN
  • 0031-9007 (ISSN-L)
  • 1079-7114
OpenAlex
W2022145612
Cited by
369
References
2
FWCI
21.69
Type
journal article
Language
en
Open access
green

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CoChat. (2026). Citation check: Intrinsic and extrinsic corrugation of monolayer graphene deposited onSiO2. https://app.cochat.ai/papers/10.1103/physrevlett.102.076102
The paper
Geringer, V., Liebmann, M., Echtermeyer, T., Runte, S., Schmidt, M., Rückamp, R., Lemme, M. C., & Morgenstern, M. (2009). Intrinsic and extrinsic corrugation of monolayer graphene deposited onSiO2. Physical Review Letters. https://doi.org/10.1103/physrevlett.102.076102

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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

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