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Cited by 302

The DOI matches its Crossref record; 17 of the 17 references it cites were found in a registry or an index.

Increased Phonon Scattering by Nanograins and Point Defects in Nanostructured Silicon with a Low Concentration of Germanium

Open access
Zhu, G. H., Lee, H., Lan, Y. C., Wang, X. W., Joshi, G., Wang, D. Z., Yang, J., Vashaee, D., Guilbert, H., Pillitteri, A., Dresselhaus, M. S., Chen, G., Ren, Z. F.·2009·Physical Review Letters

Abstract

The mechanism for phonon scattering by nanostructures and by point defects in nanostructured silicon (Si) and the silicon germanium (Ge) alloy and their thermoelectric properties are investigated. We found that the thermal conductivity is reduced by a factor of 10 in nanostructured Si in comparison with bulk crystalline Si. However, nanosize interfaces are not as effective as point defects in scattering phonons with wavelengths shorter than 1 nm. We further found that a 5 at. % Ge replacing Si is very efficient in scattering phonons shorter than 1 nm, resulting in a further thermal conductivity reduction by a factor of 2, thereby leading to a thermoelectric figure of merit 0.95 for Si95Ge5, similar to that of large grained Si80Ge20 alloys.

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Metadata

Authors
Zhu, G. H., Lee, H., Lan, Y. C., Wang, X. W., Joshi, G., Wang, D. Z., Yang, J., Vashaee, D., Guilbert, H., Pillitteri, A., Dresselhaus, M. S., Chen, G., & Ren, Z. F.
Venue
Physical Review Letters
Published
2009-05-14
Volume
102
Issue
19
Pages
196803-196803
ISSN
  • 0031-9007 (ISSN-L)
  • 1079-7114
OpenAlex
W1987675027
Cited by
302
References
17
FWCI
9.25
Type
journal article
Language
en
Open access
bronze

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CoChat. (2026). Citation check: Increased Phonon Scattering by Nanograins and Point Defects in Nanostructured Silicon with a Low Concentration of Germanium. https://app.cochat.ai/papers/10.1103/physrevlett.102.196803
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Zhu, G. H., Lee, H., Lan, Y. C., Wang, X. W., Joshi, G., Wang, D. Z., Yang, J., Vashaee, D., Guilbert, H., Pillitteri, A., Dresselhaus, M. S., Chen, G., & Ren, Z. F. (2009). Increased Phonon Scattering by Nanograins and Point Defects in Nanostructured Silicon with a Low Concentration of Germanium. Physical Review Letters. https://doi.org/10.1103/physrevlett.102.196803

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