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Accurate Measurement of Electron Beam Induced Displacement Cross Sections for Single-Layer Graphene
Open accessAbstract
We present an accurate measurement and a quantitative analysis of electron-beam-induced displacements of carbon atoms in single-layer graphene. We directly measure the atomic displacement ("knock-on") cross section by counting the lost atoms as a function of the electron-beam energy and applied dose. Further, we separate knock-on damage (originating from the collision of the beam electrons with the nucleus of the target atom) from other radiation damage mechanisms (e.g., ionization damage or chemical etching) by the comparison of ordinary (12C) and heavy (13C) graphene. Our analysis shows that a static lattice approximation is not sufficient to describe knock-on damage in this material, while a very good agreement between calculated and experimental cross sections is obtained if lattice vibrations are taken into account.
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Two-dimensional atomic crystals
Novoselov, K. S., Jiang, D., Schedin, F., Booth, T. J., Khotkevich, V. V., Morozov, S. V., & Geim, A. K. (2005) · Proceedings of the National Academy of Sciences · doi:10.1073/pnas.0502848102 · Cited by 11,788
Kroto, H. W., Allaf, A. W., & Balm, S. P. (1991) · Chemical Reviews · doi:10.1021/cr00006a005 · Cited by 1,088
Cited by
Control of Radiation Damage in MoS2 by Graphene Encapsulation
Zan, R., Ramasse, Q. M., Jalil, R., Georgiou, T., Bangert, U., & Novoselov, K. S. (2013) · ACS Nano · doi:10.1021/nn4044035 · Cited by 286
Ke, X., Bittencourt, C., & Van Tendeloo, G. (2015) · Beilstein Journal of Nanotechnology · doi:10.3762/bjnano.6.158 · Cited by 45
Metadata
- Authors
- Meyer, J. C., Eder, F., Kurasch, S., Skakalova, V., Kotakoski, J., Park, H. J., Roth, S., Chuvilin, A., Eyhusen, S., Benner, G., Krasheninnikov, A. V., & Kaiser, U.
- Venue
- Physical Review Letters
- Publisher
- American Physical Society (APS)
- Published
- 2012-05-07
- Volume
- 108
- Issue
- 19
- Pages
- 196102-196102
- ISSN
- 0031-9007 (ISSN-L)
- 1079-7114
- OpenAlex
- W2053013917
- Cited by
- 455
- References
- 2
- FWCI
- 20.13
- Type
- journal article
- Language
- en
- Open access
- green
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- Meyer, J. C., Eder, F., Kurasch, S., Skakalova, V., Kotakoski, J., Park, H. J., Roth, S., Chuvilin, A., Eyhusen, S., Benner, G., Krasheninnikov, A. V., & Kaiser, U. (2012). Accurate Measurement of Electron Beam Induced Displacement Cross Sections for Single-Layer Graphene. Physical Review Letters. https://doi.org/10.1103/physrevlett.108.196102
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