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Surface Roughness of Water Measured by X-Ray Reflectivity
Open accessAbstract
The roughness of the liquid-vapor interface for pure water was measured by a technique of x-ray reflectivity. With synchrotron radiation ($\ensuremath{\lambda}\ensuremath{\sim}1.5$ \AA{}A), the angular dependence of the x-ray reflectivity was measured from grazing incidence (\ensuremath{\sim}0.0021 rad), where the reflectivity was greater than 0.96, to an incident angle of \ensuremath{\sim}0.05 rad, where the reflectivity was \ensuremath{\sim}7\ifmmode\times\else\texttimes\fi{}${10}^{\ensuremath{-}8}$. A fit to the data by a theory with only one adjustable parameter obtains 3.2 \AA{}A for the root-mean-square roughness of the water surface.
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Yaseen, M., Lu, J. R., Webster, J. R. P., & Penfold, J. (2006) · Langmuir · doi:10.1021/la053316z · Cited by 92
Hakim, S. S., Olsson, M. H. M., Sørensen, H. O., Bovet, N., Bohr, J., Feidenhans’l, R., & Stipp, S. L. S. (2017) · Scientific Reports · doi:10.1038/s41598-017-06977-4 · Cited by 66
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Metadata
- Authors
- Braslau, A., Deutsch, M., Pershan, P. S., Weiss, A. H., Als-Nielsen, J., & Bohr, J.
- Venue
- Physical Review Letters
- Publisher
- American Physical Society (APS)
- Published
- 1985-01-14
- Volume
- 54
- Issue
- 2
- Pages
- 114-117
- ISSN
- 0031-9007 (ISSN-L)
- OpenAlex
- W1997240962
- Cited by
- 420
- References
- 0
- FWCI
- 17.84
- Type
- journal article
- Language
- en
- Open access
- green
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- Braslau, A., Deutsch, M., Pershan, P. S., Weiss, A. H., Als-Nielsen, J., & Bohr, J. (1985). Surface Roughness of Water Measured by X-Ray Reflectivity. Physical Review Letters. https://doi.org/10.1103/physrevlett.54.114
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