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Far-Infrared Properties ofURu2Si2

Bonn, D. A., Garrett, J. D., Timusk, T.·1988·Physical Review Letters

Abstract

Measurements of the far-infrared reflectance of ${\mathrm{URu}}_{2}$${\mathrm{Si}}_{2}$ between 10 and 720 ${\mathrm{cm}}^{\ensuremath{-}1}$ have been made at temperatures from 2 to 90 K. Above the coherence temperature the optical conductivity increases monotonically with increasing frequency and at lower temperatures the development of the narrow mode responsible for the high dc conductivity is clearly observed. In the antiferromagnetic state an energy gap with a size between 46 and 65 ${\mathrm{cm}}^{\ensuremath{-}1}$ is observed whose shape is reminiscent of the energy gap observed in the spin-density-wave state of Cr.

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Metadata

Authors
Bonn, D. A., Garrett, J. D., & Timusk, T.
Venue
Physical Review Letters
Published
1988-09-12
Volume
61
Issue
11
Pages
1305-1308
ISSN
0031-9007 (ISSN-L)
OpenAlex
W182930986
Cited by
195
References
0
FWCI
1.35
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: Far-Infrared Properties ofURu2Si2. https://app.cochat.ai/papers/10.1103/physrevlett.61.1305
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Bonn, D. A., Garrett, J. D., & Timusk, T. (1988). Far-Infrared Properties ofURu2Si2. Physical Review Letters. https://doi.org/10.1103/physrevlett.61.1305

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