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Evolution of the Fermi Surface with Carrier Concentration inBi2Sr2CaCu2O8+δ
Open accessAbstract
We show, by use of angle-resolved photoemission spectroscopy, that underdoped ${\mathrm{Bi}}_{2}{\mathrm{Sr}}_{2}{\mathrm{CaCu}}_{2}{\mathrm{O}}_{8+\ensuremath{\delta}}$ appears to have a large Fermi surface centered at $(\ensuremath{\pi},\ensuremath{\pi})$, even for samples with a ${T}_{c}$ as low as 15 K. No clear evidence of a Fermi surface pocket around $(\ensuremath{\pi}/2,\ensuremath{\pi}/2)$ has been found. These conclusions are based on a determination of the minimum gap locus in the pseudogap regime ${T}_{c}<T<{T}^{*}$, which is found to coincide with the locus of gapless excitations in momentum space (Fermi surface) determined above ${T}^{*}$. These results suggest that the pseudogap is more likely of precursor pairing rather than magnetic origin.
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Citations
Cited by
Angle-resolved photoemission studies of the cuprate superconductors
Damascelli, A., Hussain, Z., & Shen, Z.-X. (2003) · Reviews of Modern Physics · doi:10.1103/revmodphys.75.473 · Cited by 3,775
The pseudogap in high-temperature superconductors: an experimental survey
Timusk, T., & Statt, B. (1999) · Reports on Progress in Physics · doi:10.1088/0034-4885/62/1/002 · Cited by 2,121
Electrodynamics of high-Tcsuperconductors
Basov, D. N., & Timusk, T. (2005) · Reviews of Modern Physics · doi:10.1103/revmodphys.77.721 · Cited by 788
Metadata
- Authors
- Ding, H., Norman, M. R., Yokoya, T., Takeuchi, T., Randeria, M., Campuzano, J. C., Takahashi, T., Mochiku, T., & Kadowaki, K.
- Venue
- Physical Review Letters
- Publisher
- American Physical Society (APS)
- Published
- 1997-03-31
- Volume
- 78
- Issue
- 13
- Pages
- 2628-2631
- ISSN
- 0031-9007 (ISSN-L)
- 1079-7114
- OpenAlex
- W2126574979
- Cited by
- 236
- References
- 0
- FWCI
- 26.41
- Type
- journal article
- Language
- en
- Open access
- green
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- Ding, H., Norman, M. R., Yokoya, T., Takeuchi, T., Randeria, M., Campuzano, J. C., Takahashi, T., Mochiku, T., & Kadowaki, K. (1997). Evolution of the Fermi Surface with Carrier Concentration inBi2Sr2CaCu2O8+δ. Physical Review Letters. https://doi.org/10.1103/physrevlett.78.2628
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