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Cited by 373

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“Electronic Growth” of Metallic Overlayers on Semiconductor Substrates

Zhang, Zhenyu, Niu, Qian, Shih, Chih-Kang·1998·Physical Review Letters

Abstract

We present a novel ``electronic growth'' model for metallic thin films on semiconductor substrates. Depending on the competition between the effects of quantum confinement, charge spilling, and interface-induced Friedel oscillations, different types of film stability are defined, as characterized by the existence of critical/magic thicknesses for smooth growth. In particular, smooth growth can be achieved only above a few monolayers for noble metals, and only for the first layer for alkali metals.

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Metadata

Authors
Zhang, Z., Niu, Q., & Shih, C.-K.
Venue
Physical Review Letters
Published
1998-06-15
Volume
80
Issue
24
Pages
5381-5384
ISSN
  • 0031-9007 (ISSN-L)
  • 1079-7114
OpenAlex
W50134595
Cited by
373
References
0
FWCI
8.34
Type
journal article
Language
en
Open access
closed

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CoChat. (2026). Citation check: “Electronic Growth” of Metallic Overlayers on Semiconductor Substrates. https://app.cochat.ai/papers/10.1103/physrevlett.80.5381
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Zhang, Z., Niu, Q., & Shih, C.-K. (1998). “Electronic Growth” of Metallic Overlayers on Semiconductor Substrates. Physical Review Letters. https://doi.org/10.1103/physrevlett.80.5381

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Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.