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Spin-Polarized Scanning Tunneling Microscopy with Antiferromagnetic Probe Tips
Abstract
We have performed low temperature spin-polarized scanning tunneling microscopy (SP-STM) of two monolayers Fe on W(110) using tungsten tips coated with different magnetic materials. We observe stripe domains with a magnetic period of 50 +/- 5 nm. Employing Cr as a coating material we recorded SP-STM images with an antiferromagnetic probe tip. The advantage of its vanishing dipole field is most apparent in external magnetic fields. This new approach resolves the problem of the disturbing influence of a ferromagnetic tip in the investigation of soft magnetic materials and superparamagnetic particles.
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Cited by
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Self-citationHeide, M., Bihlmayer, G., & Blügel, S. (2008) · Physical Review B · doi:10.1103/physrevb.78.140403 · Cited by 543
Brede, J., Atodiresei, N., Kuck, S., Lazić, P., Caciuc, V., Morikawa, Y., Hoffmann, G., Blügel, S., & Wiesendanger, R. (2010) · Physical Review Letters · doi:10.1103/physrevlett.105.047204 · Cited by 287
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Metadata
- Authors
- Kubetzka, A., Bode, M., Pietzsch, O., & Wiesendanger, R.
- Venue
- Physical Review Letters
- Publisher
- American Physical Society (APS)
- Published
- 2002-01-18
- Volume
- 88
- Issue
- 5
- Pages
- 057201-057201
- ISSN
- 0031-9007 (ISSN-L)
- 1079-7114
- OpenAlex
- W2046563665
- Cited by
- 287
- References
- 0
- FWCI
- 11.19
- Type
- journal article
- Language
- en
- Open access
- closed
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