The DOI matches its Crossref record; 2 of the 2 references it cites were found in a registry or an index.
Unified Treatment of Fluorescence and Raman Scattering Processes near Metal Surfaces
Open accessAbstract
We present a general model study of surface-enhanced resonant Raman scattering and fluorescence focusing on the interplay between electromagnetic effects and the molecular dynamics. Our model molecule is placed close to two Ag nanoparticles and has two electronic levels. A Franck-Condon mechanism provides electron-vibration coupling. Using realistic parameter values for the molecule we find that an electromagnetic enhancement by 10 orders of magnitude can yield Raman cross sections sigma(R) of the order 10(-14) cm(2). We also discuss the dependence of sigma(R) on incident laser intensity.
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cites
Scully, M. O., & Zubairy, M. S. (1997) · doi:10.1017/cbo9780511813993 · Cited by 6,589
Sakurai, J. J., & Freedman, D. Z. (1968) · American Journal of Physics · doi:10.1119/1.1974573 · Cited by 2,022
Cited by
Theoretical Studies of Plasmonics using Electronic Structure Methods
Morton, S. M., Silverstein, D. W., & Jensen, L. (2011) · Chemical Reviews · doi:10.1021/cr100265f · Cited by 474
Rigorous justification of the |E|4 enhancement factor in Surface Enhanced Raman Spectroscopy
Le Ru, E. C., & Etchegoin, P. G. (2006) · Chemical Physics Letters · doi:10.1016/j.cplett.2006.03.042 · Cited by 432
Metadata
- Authors
- Xu, H., Wang, X.-H., Persson, M. P., Xu, H. Q., Käll, M., & Johansson, P.
- Venue
- Physical Review Letters
- Publisher
- American Physical Society (APS)
- Published
- 2004-12-06
- Volume
- 93
- Issue
- 24
- Pages
- 243002-243002
- ISSN
- 0031-9007 (ISSN-L)
- 1079-7114
- OpenAlex
- W2141116756
- Cited by
- 207
- References
- 2
- FWCI
- 7.61
- Type
- journal article
- Language
- en
- Open access
- green
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: Unified Treatment of Fluorescence and Raman Scattering Processes near Metal Surfaces. https://app.cochat.ai/papers/10.1103/physrevlett.93.243002
- The paper
- Xu, H., Wang, X.-H., Persson, M. P., Xu, H. Q., Käll, M., & Johansson, P. (2004). Unified Treatment of Fluorescence and Raman Scattering Processes near Metal Surfaces. Physical Review Letters. https://doi.org/10.1103/physrevlett.93.243002
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
