Student or educator? Sign up with your school email and get 6 months of Pro free.
Cited by 179

The DOI matches its Crossref record; 1 of the 1 references it cites were found in a registry or an index.

Imaging Spin Flows in Semiconductors Subject to Electric, Magnetic, and Strain Fields

Open access
Crooker, S. A., Smith, D. L.·2005·Physical Review Letters

Abstract

Using scanning Kerr microscopy, we directly acquire two-dimensional images of spin-polarized electrons flowing laterally in bulk epilayers of n:GaAs. Optical injection provides a local dc source of polarized electrons, whose subsequent drift and/or diffusion is controlled with electric, magnetic, and--in particular--strain fields. Spin precession induced by controlled uniaxial stress along the <110> axes demonstrates the direct k-linear spin-orbit coupling of electron spin to the shear (off diagonal) components of the strain tensor, epsilon(xy).

Overview

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Integrity signals

Registry

Crossref · 10.1103/physrevlett.94.236601

Cites

1 of 1 references verified0 citation errors · 0 not checkable

Statistics

Verification

Claims the paper makes

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Self-check

Percentages, sums and reported differences re-computed from the paper’s own numbers.

The self-check needs the paper’s full text.

Citations

Cites

Show all 1 references

Cited by

See all 179

Metadata

Authors
Crooker, S. A., & Smith, D. L.
Venue
Physical Review Letters
Published
2005-06-15
Volume
94
Issue
23
Pages
236601-236601
ISSN
  • 0031-9007 (ISSN-L)
  • 1079-7114
OpenAlex
W2030605240
Cited by
179
References
1
FWCI
13.93
Type
journal article
Language
en
Open access
green

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

What counts as a claim ›How we measure confidence ›How we check this ›

Are you an author, or do you see a problem with this page? Request a review

How to cite

Cite CoChat for the checks on this page, and the paper for its own findings.

This page
CoChat. (2026). Citation check: Imaging Spin Flows in Semiconductors Subject to Electric, Magnetic, and Strain Fields. https://app.cochat.ai/papers/10.1103/physrevlett.94.236601
The paper
Crooker, S. A., & Smith, D. L. (2005). Imaging Spin Flows in Semiconductors Subject to Electric, Magnetic, and Strain Fields. Physical Review Letters. https://doi.org/10.1103/physrevlett.94.236601

Data sources

Bibliographic data: Semantic Scholar, OpenAlex, Crossref.

Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.