Student or educator? Sign up with your school email and get 6 months of Pro free.
Cited by 268

The DOI matches its Crossref record; 3 of the 3 references it cites were found in a registry or an index.

Surface plasmon enhanced light-emitting diode

Vuckovic, J., Loncar, M., Scherer, A.·2000·IEEE Journal of Quantum Electronics

Abstract

A method for enhancing the emission properties of light-emitting diodes, by coupling to surface plasmons, is analyzed both theoretically and experimentally. The analyzed structure consists of a semiconductor emitter layer thinner than /spl lambda//2 sandwiched between two metal films. If a periodic pattern is defined in the top semitransparent metal layer by lithography, it is possible to efficiently couple out the light emitted from the semiconductor and to simultaneously enhance the spontaneous emission rate. For the analyzed designs, we theoretically estimate extraction efficiencies as high as 37% and Purcell factors of up to 4.5. We have experimentally measured photoluminescence intensities of up to 46 times higher in fabricated structures compared to unprocessed wafers. The increased light emission is due to an increase in the efficiency and an increase in the pumping intensity resulting from trapping of pump photons within the microcavity.

Overview

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Integrity signals

Registry

Crossref · 10.1109/3.880653

Cites

3 of 3 references verified0 citation errors · 0 not checkable

Statistics

Verification

Claims the paper makes

The claims and statistics of this paper haven’t been checked yet.

Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.

A few free checks a day · papers already verified open instantly · results are public

Self-check

Percentages, sums and reported differences re-computed from the paper’s own numbers.

The self-check needs the paper’s full text.

Citations

Cites

Show all 3 references

Cited by

See all 268

Metadata

Authors
Vuckovic, J., Loncar, M., & Scherer, A.
Venue
IEEE Journal of Quantum Electronics
Published
2000-10
Volume
36
Issue
10
Pages
1131-1144
ISSN
  • 0018-9197 (ISSN-L)
  • 1558-1713
OpenAlex
W2053282628
Cited by
268
References
3
FWCI
6.40
Type
journal article
Language
en
Open access
closed

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

What counts as a claim ›How we measure confidence ›How we check this ›

Are you an author, or do you see a problem with this page? Request a review

How to cite

Cite CoChat for the checks on this page, and the paper for its own findings.

This page
CoChat. (2026). Citation check: Surface plasmon enhanced light-emitting diode. https://app.cochat.ai/papers/10.1109/3.880653
The paper
Vuckovic, J., Loncar, M., & Scherer, A. (2000). Surface plasmon enhanced light-emitting diode. IEEE Journal of Quantum Electronics. https://doi.org/10.1109/3.880653

Data sources

Bibliographic data: Semantic Scholar, OpenAlex, Crossref.

Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.