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Radiometric CCD camera calibration and noise estimation
Abstract
Changes in measured image irradiance have many physical causes and are the primary cue for several visual processes, such as edge detection and shape from shading. Using physical models for charged-coupled device (CCD) video cameras and material reflectance, we quantify the variation in digitized pixel values that is due to sensor noise and scene variation. This analysis forms the basis of algorithms for camera characterization and calibration and for scene description. Specifically, algorithms are developed for estimating the parameters of camera noise and for calibrating a camera to remove the effects of fixed pattern nonuniformity and spatial variation in dark current. While these techniques have many potential uses, we describe in particular how they can be used to estimate a measure of scene variation. This measure is independent of image irradiance and can be used to identify a surface from a single sensor band over a range of situations. Experimental results confirm that the models presented in this paper are useful for modeling the different sources of variation in real images obtained from video cameras.>
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Cited by
Automatic Estimation and Removal of Noise from a Single Image
Liu, C., Szeliski, R., Kang, S. B., Zitnick, C. L., & Freeman, W. T. (2008) · IEEE Transactions on Pattern Analysis and Machine Intelligence · doi:10.1109/tpami.2007.1176 · Cited by 486
Burst Denoising with Kernel Prediction Networks
Mildenhall, B., Barron, J. T., Chen, J., Sharlet, D., Ng, R., & Carroll, R. (2018) · 2018 IEEE/CVF Conference on Computer Vision and Pattern Recognition · doi:10.1109/cvpr.2018.00265 · Cited by 404
Joint demosaicing and denoising
Hirakawa, K., & Parks, T. W. (2006) · IEEE Transactions on Image Processing · doi:10.1109/tip.2006.875241 · Cited by 138
Blind PRNU-Based Image Clustering for Source Identification
Marra, F., Poggi, G., Sansone, C., & Verdoliva, L. (2017) · IEEE Transactions on Information Forensics and Security · doi:10.1109/tifs.2017.2701335 · Cited by 84
Metadata
- Authors
- Healey, G. E., & Kondepudy, R.
- Venue
- IEEE Transactions on Pattern Analysis and Machine Intelligence
- Published
- 1994-03
- Volume
- 16
- Issue
- 3
- Pages
- 267-276
- ISSN
- 0162-8828 (ISSN-L)
- OpenAlex
- W2163446914
- Cited by
- 739
- References
- 0
- FWCI
- 7.81
- Type
- journal article
- Language
- en
- Open access
- closed
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