The DOI matches its Crossref record.
Measurement of temperature in active high-power AlGaN/GaN HFETs using Raman spectroscopy
Abstract
We report on the noninvasive measurement of temperature, i.e., self-heating effects, in active AlGaN/GaN HFETs grown on sapphire and SiC substrates. Micro-Raman spectroscopy was used to produce temperature maps with /spl ap/1 μm spatial resolution and a temperature accuracy of better than 10/spl deg/C. Significant temperature rises up to 180/spl deg/C were measured in the device gate-drain opening. Results from a three-dimensional (3-D) heat dissipation model are in reasonably good agreement with the experimental data. Comparison of devices fabricated on sapphire and SiC substrates indicated that the SiC substrate devices had /spl sim/5 times lower thermal resistance.
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cited by
Ultrawide‐Bandgap Semiconductors: Research Opportunities and Challenges
Tsao, J. Y., Chowdhury, S., Hollis, M. A., Jena, D., Johnson, N. M., Jones, K. A., Kaplar, R. J., Rajan, S., Van de Walle, C. G., Bellotti, E., et al. (2018) · Advanced Electronic Materials · doi:10.1002/aelm.201600501 · Cited by 1,602
Graphene quilts for thermal management of high-power GaN transistors
Yan, Z., Liu, G., Khan, J. M., & Balandin, A. A. (2012) · Nature Communications · doi:10.1038/ncomms1828 · Cited by 543
Sarua, A., Ji, H., Kuball, M., Uren, M. J., Martin, T., Hilton, K. P., & Balmer, R. S. (2006) · IEEE Transactions on Electron Devices · doi:10.1109/ted.2006.882274 · Cited by 267
Self-citationMonolithic Integrated Micro-Thin-Film Thermocouples for On-Chip Temperature Measurement of GaN HEMTs
Irshad Bhatti, H., Yuvaraja, S., Wang, C., Tang, X., & Li, X. (2024) · IEEE Transactions on Electron Devices · doi:10.1109/ted.2024.3487815 · Cited by 13
Metadata
- Authors
- Kuball, M., Hayes, J. M., Uren, M. J., Martin, I., Birbeck, J. C. H., Balmer, R. S., & Hughes, B. T.
- Venue
- IEEE Electron Device Letters
- Published
- 2002-01
- Volume
- 23
- Issue
- 1
- Pages
- 7-9
- ISSN
- 0741-3106 (ISSN-L)
- 1558-0563
- OpenAlex
- W2103125572
- Cited by
- 358
- References
- 0
- FWCI
- 12.15
- Type
- journal article
- Language
- en
- Open access
- closed
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: Measurement of temperature in active high-power AlGaN/GaN HFETs using Raman spectroscopy. https://app.cochat.ai/papers/10.1109/55.974795
- The paper
- Kuball, M., Hayes, J. M., Uren, M. J., Martin, I., Birbeck, J. C. H., Balmer, R. S., & Hughes, B. T. (2002). Measurement of temperature in active high-power AlGaN/GaN HFETs using Raman spectroscopy. IEEE Electron Device Letters. https://doi.org/10.1109/55.974795
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
