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Cited by 12

The DOI matches its Crossref record.

Balancing of peak currents between paralleled SiC MOSFETs by source impedances

Mao, Yincan, Miao, Zichen, Ngo, Khai D. T., Wang, Chi-Ming·2017·2017 IEEE Applied Power Electronics Conference and Exposition (APEC)
DOI 10.1109/apec.2017.7930787
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Abstract

The peak switching currents of two paralleled MOSFETs turned on/off by one gate driver could differ significantly owing to the mismatch in threshold voltages (Vth). The passive balancing method described herein employs one inductor and one resistor per MOSFET to force the currents to track with negligible penalty in loss. Sensors, feedbacks, and knowledge of gate-related parameters (like gate charge, polarity of Vthdifference, gate impedances, etc.) are not required. The passive components are designed using an inequality involving Vth, rise time, and unbalance percentage. The mismatch in peak currents is reduced from 15% to 1% between SiC MOSFETs tested at 20 A and 300 V with 19% Vthvariation.

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Research works printed but not linked: 11

  1. 10.1109/TPEL.2015.2477831 · DOI · Paper page
  2. 10.1109/ECCE.2013.6646891 · DOI
  3. 10.1109/TPEL.2014.2304454 · DOI
  4. 10.1109/APEC.2013.6520216 · DOI · Paper page
  5. 10.1109/IPEC.2010.5543851 · DOI
  6. 10.1109/TPS.2008.2003971 · DOI · Paper page
  7. 10.1109/TPEL.2015.2408054 · DOI · Paper page
  8. 10.1109/ECCE.2011.6064173 · DOI · Paper page
  9. gangyao, 2014, Dynamic and static behavior of packaged silicon carbide MOSFETs in paralleled applications, Appl Power Electron Conference and Exposition (APEC) 2014 Twenty-Ninth Annual IEEE, 1478
  10. 10.1109/TPEL.2012.2195332 · DOI
  11. 10.1109/ECCE.2009.5316038 · DOI

Cited by

Metadata

Authors
Mao, Y., Miao, Z., Ngo, K. D. T., & Wang, C.-M.
Venue
2017 IEEE Applied Power Electronics Conference and Exposition (APEC)
Publisher
IEEE
Published
2017-03
Pages
800-803
DOI
10.1109/apec.2017.7930787
Cited by
12
References
0

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Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

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Data sources

Bibliographic data: Semantic Scholar, OpenAlex, Crossref.

Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).

Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.