The DOI matches its Crossref record; 4 of the 4 references it cites were found in a registry or an index.
Personalized defect prediction
Abstract
Many defect prediction techniques have been proposed. While they often take the author of the code into consideration, none of these techniques build a separate prediction model for each developer. Different developers have different coding styles, commit frequencies, and experience levels, causing different defect patterns. When the defects of different developers are combined, such differences are obscured, hurting prediction performance. This paper proposes personalized defect prediction-building a separate prediction model for each developer to predict software defects. As a proof of concept, we apply our personalized defect prediction to classify defects at the file change level. We evaluate our personalized change classification technique on six large software projects written in C and Java-the Linux kernel, PostgreSQL, Xorg, Eclipse, Lucene and Jackrabbit. Our personalized approach can discover up to 155 more bugs than the traditional change classification (210 versus 55) if developers inspect the top 20% lines of code that are predicted buggy. In addition, our approach improves the F1-score by 0.01-0.06 compared to the traditional change classification.
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Cites
LIBSVM: A library for support vector machines
Chang, C.-C., & Lin, C.-J. (2011) · ACM Transactions on Intelligent Systems and Technology · doi:10.1145/1961189.1961199 · Cited by 40,918
The WEKA data mining software: an update
Hall, M., Frank, E., Holmes, G., Pfahringer, B., Reutemann, P., & Witten, I. H. (2009) · ACM SIGKDD Explorations Newsletter · doi:10.1145/1656274.1656278 · Cited by 17,750
Social Networks, Personalized Advertising, and Privacy Controls
Tucker, C. E. (2014) · Journal of Marketing Research · doi:10.1509/jmr.10.0355 · Cited by 829
Use of relative code churn measures to predict system defect density
Nagappan, N., & Ball, T. (2005) · Proceedings of the 27th international conference on Software engineering - ICSE '05 · doi:10.1145/1062455.1062514 · Cited by 775
Cited by
Automatically learning semantic features for defect prediction
Wang, S., Liu, T., & Tan, L. (2016) · Proceedings of the 38th International Conference on Software Engineering · doi:10.1145/2884781.2884804 · Cited by 689
Self-citationRevisiting the Impact of Classification Techniques on the Performance of Defect Prediction Models
Ghotra, B., McIntosh, S., & Hassan, A. E. (2015) · 2015 IEEE/ACM 37th IEEE International Conference on Software Engineering · doi:10.1109/icse.2015.91 · Cited by 364
An empirical study on software defect prediction with a simplified metric set
He, P., Li, B., Liu, X., Chen, J., & Ma, Y. (2015) · Information and Software Technology · doi:10.1016/j.infsof.2014.11.006 · Cited by 309
HYDRA: Massively Compositional Model for Cross-Project Defect Prediction
Xia, X., Lo, D., Pan, S. J., Nagappan, N., & Wang, X. (2016) · IEEE Transactions on Software Engineering · doi:10.1109/tse.2016.2543218 · Cited by 293
Predicting Defective Lines Using a Model-Agnostic Technique
Wattanakriengkrai, S., Thongtanunam, P., Tantithamthavorn, C., Hata, H., & Matsumoto, K. (2022) · IEEE Transactions on Software Engineering · doi:10.1109/tse.2020.3023177 · Cited by 137
Metadata
- Authors
- Jiang, T., Tan, L., & Kim, S.
- Venue
- 2013 28th IEEE/ACM International Conference on Automated Software Engineering (ASE)
- Publisher
- IEEE
- Published
- 2013-11
- Pages
- 279-289
- OpenAlex
- W1978859404
- Cited by
- 240
- References
- 4
- FWCI
- 10.49
- Type
- conference paper
- Language
- en
- Open access
- closed
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