The DOI matches its Crossref record; 63 of the 64 references it cites were found in a registry or an index.
The Power of Ensembles for Active Learning in Image Classification
Abstract
Deep learning methods have become the de-facto standard for challenging image processing tasks such as image classification. One major hurdle of deep learning approaches is that large sets of labeled data are necessary, which can be prohibitively costly to obtain, particularly in medical image diagnosis applications. Active learning techniques can alleviate this labeling effort. In this paper we investigate some recently proposed methods for active learning with high-dimensional data and convolutional neural network classifiers. We compare ensemble-based methods against Monte-Carlo Dropout and geometric approaches. We find that ensembles perform better and lead to more calibrated predictive uncertainties, which are the basis for many active learning algorithms. To investigate why Monte-Carlo Dropout uncertainties perform worse, we explore potential differences in isolation in a series of experiments. We show results for MNIST and CIFAR-10, on which we achieve a test set accuracy of 90% with roughly 12,200 labeled images, and initial results on ImageNet. Additionally, we show results on a large, highly class-imbalanced diabetic retinopathy dataset. We observe that the ensemble-based active learning effectively counteracts this imbalance during acquisition.
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“We observe that this difference is maintained in the other cycles, including the last active learning cycle where our method outperforms the semisupervised method, multi-model methods [9, 12] and the best AL method [5] by 1 . 6% .”
From Not All Labels Are Equal: Rationalizing The Labeling Costs for Training Object Detection (2021) · cites this paper as [9]
Citations
Cites
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1 of the 64 references couldn’t be matched to a known paper.
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A review of uncertainty quantification in deep learning: Techniques, applications and challenges
Abdar, M., Pourpanah, F., Hussain, S., Rezazadegan, D., Liu, L., Ghavamzadeh, M., Fieguth, P., Cao, X., Khosravi, A., Acharya, U. R., et al. (2021) · Information Fusion · doi:10.1016/j.inffus.2021.05.008 · Cited by 3,111
“• The results of our research show that although a variety of ensemble methods [474], [475], [476], [477], [478], [479], [480] also have a high ability to deal with uncertainty along with good performance and optimizing the performance of other methods, these high capabilities of these methods have not been used more…”
BackgroundEnsemble deep learning: A review
Ganaie, M. A., Hu, M., Malik, A. K., Tanveer, M., & Suganthan, P. N. (2022) · Engineering Applications of Artificial Intelligence · doi:10.1016/j.engappai.2022.105151 · Cited by 2,446
A survey of uncertainty in deep neural networks
Gawlikowski, J., Tassi, C. R. N., Ali, M., Lee, J., Humt, M., Feng, J., Kruspe, A., Triebel, R., Jung, P., Roscher, R., et al. (2023) · Artificial Intelligence Review · doi:10.1007/s10462-023-10562-9 · Cited by 1,670
Uninformed Students: Student-Teacher Anomaly Detection With Discriminative Latent Embeddings
Bergmann, P., Fauser, M., Sattlegger, D., & Steger, C. (2020) · 2020 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) · doi:10.1109/cvpr42600.2020.00424 · Cited by 990
Learning Loss for Active Learning
Yoo, D., & Kweon, I. S. (2019) · 2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) · doi:10.1109/cvpr.2019.00018 · Cited by 740
Metadata
- Authors
- Beluch, W. H., Genewein, T., Nurnberger, A., & Kohler, J. M.
- Affiliations
- Robert Bosch (United States) (US)
- ORCID
- Genewein, Tim
- Venue
- 2018 IEEE/CVF Conference on Computer Vision and Pattern Recognition
- Publisher
- IEEE
- Published
- 2018-06
- Pages
- 9368-9377
- ISSN
- 1063-6919 (ISSN-L)
- OpenAlex
- W2798820905
- Cited by
- 655
- References
- 64
- Citations by year
- 2026: 33 · 2025: 69 · 2024: 117 · 2023: 120 · 2022: 94 · 2021: 115 · 2020: 72 · 2019: 31 · 2018: 4
- FWCI
- 22.66
- Type
- conference paper
- Language
- en
- Open access
- closed
- Locations
- IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings - IEEE Computer Society Conference on Computer Vision and Pattern Recognition/Proceedings (publishedVersion)
- Topics
- Physical Sciences › Computer Science › Artificial Intelligence › Machine Learning and Algorithms
- Physical Sciences › Computer Science › Artificial Intelligence › Domain Adaptation and Few-Shot Learning
- Physical Sciences › Computer Science › Artificial Intelligence › Machine Learning and Data Classification
- Keywords
- active learning (machine learning), image classification, ensemble methods, Monte Carlo dropout, uncertainty estimation, convolutional neural networks, class imbalance, diabetic retinopathy, medical image diagnosis, high-dimensional data
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