The DOI matches its Crossref record; 11 of the 11 references it cites were found in a registry or an index.
Finding Task-Relevant Features for Few-Shot Learning by Category Traversal
Open accessAbstract
Few-shot learning is an important area of research. Conceptually, humans are readily able to understand new concepts given just a few examples, while in more pragmatic terms, limited-example training situations are common practice. Recent effective approaches to few-shot learning employ a metric-learning framework to learn a feature similarity comparison between a query (test) example, and the few support (training) examples. However, these approaches treat each support class independently from one another, never looking at the entire task as a whole. Because of this, they are constrained to use a single set of features for all possible test-time tasks, which hinders the ability to distinguish the most relevant dimensions for the task at hand. In this work, we introduce a Category Traversal Module that can be inserted as a plug-and-play module into most metric-learning based few-shot learners. This component traverses across the entire support set at once, identifying task-relevant features based on both intra-class commonality and inter-class uniqueness in the feature space. Incorporating our module improves performance considerably (5%-10% relative) over baseline systems on both miniImageNet and tieredImageNet benchmarks, with overall performance competitive with the most recent state-of-the-art systems.
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cites
Deep Residual Learning for Image Recognition
He, K., Zhang, X., Ren, S., & Sun, J. (2016) · 2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) · doi:10.1109/cvpr.2016.90 · Cited by 235,474
ImageNet classification with deep convolutional neural networks
Krizhevsky, A., Sutskever, I., & Hinton, G. E. (2017) · Communications of the ACM · doi:10.1145/3065386 · Cited by 112,155
Adam: A Method for Stochastic Optimization
Kingma, D. P., & Ba, J. (2014) · arXiv · doi:10.48550/arxiv.1412.6980 · Cited by 98,946
Faster R-CNN: Towards Real-Time Object Detection with Region Proposal Networks
Ren, S., He, K., Girshick, R., & Sun, J. (2017) · IEEE Transactions on Pattern Analysis and Machine Intelligence · doi:10.1109/tpami.2016.2577031 · Cited by 73,472
Faster R-CNN: Towards Real-Time Object Detection with Region Proposal Networks
Ren, S., He, K., Girshick, R., & Sun, J. (2015) · arXiv · doi:10.48550/arxiv.1506.01497 · Cited by 70,812
ImageNet: A large-scale hierarchical image database
Deng, J., Dong, W., Socher, R., Li, L.-J., Li, K., & Fei-Fei, L. (2009) · 2009 IEEE Conference on Computer Vision and Pattern Recognition · doi:10.1109/cvpr.2009.5206848 · Cited by 65,333
Model-Agnostic Meta-Learning for Fast Adaptation of Deep Networks
Finn, C., Abbeel, P., & Levine, S. (2017) · arXiv · doi:10.48550/arxiv.1703.03400 · Cited by 8,512
Zagoruyko, S., & Komodakis, N. (2016) · Procedings of the British Machine Vision Conference 2016 · doi:10.5244/c.30.87 · Cited by 7,244
On First-Order Meta-Learning Algorithms
Nichol, A., Achiam, J., & Schulman, J. (2018) · arXiv · doi:10.48550/arxiv.1803.02999 · Cited by 1,438
Dynamic Few-Shot Visual Learning Without Forgetting
Gidaris, S., & Komodakis, N. (2018) · 2018 IEEE/CVF Conference on Computer Vision and Pattern Recognition · doi:10.1109/cvpr.2018.00459 · Cited by 1,128
Cited by
Rethinking Few-Shot Image Classification: A Good Embedding is All You Need?
Tian, Y., Wang, Y., Krishnan, D., Tenenbaum, J. B., & Isola, P. (2020) · Lecture Notes in Computer Science · doi:10.1007/978-3-030-58568-6_16 · Cited by 952
Deep metric learning for few-shot image classification: A Review of recent developments
Li, X., Yang, X., Ma, Z., & Xue, J.-H. (2023) · Pattern Recognition · doi:10.1016/j.patcog.2023.109381 · Cited by 243
Fine-grained Angular Contrastive Learning with Coarse Labels
Bukchin, G., Schwartz, E., Saenko, K., Shahar, O., Feris, R., Giryes, R., & Karlinsky, L. (2021) · 2021 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR) · doi:10.1109/cvpr46437.2021.00862 · Cited by 55
Metadata
- Authors
- Li, H., Eigen, D., Dodge, S., Zeiler, M., & Wang, X.
- Venue
- 2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR)
- Publisher
- IEEE
- Published
- 2019-06
- Pages
- 1-10
- ISSN
- 1063-6919 (ISSN-L)
- OpenAlex
- W2949879676
- Cited by
- 400
- References
- 11
- FWCI
- 22.74
- Type
- conference paper
- Language
- en
- Open access
- green
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: Finding Task-Relevant Features for Few-Shot Learning by Category Traversal. https://app.cochat.ai/papers/10.1109/cvpr.2019.00009
- The paper
- Li, H., Eigen, D., Dodge, S., Zeiler, M., & Wang, X. (2019). Finding Task-Relevant Features for Few-Shot Learning by Category Traversal. 2019 IEEE/CVF Conference on Computer Vision and Pattern Recognition (CVPR). https://doi.org/10.1109/cvpr.2019.00009
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.
