The DOI matches its Crossref record; 7 of the 7 references it cites were found in a registry or an index.
Enhanced Deep Residual Networks for Single Image Super-Resolution
Open accessAbstract
Recent research on super-resolution has progressed with the development of deep convolutional neural networks (DCNN). In particular, residual learning techniques exhibit improved performance. In this paper, we develop an enhanced deep super-resolution network (EDSR) with performance exceeding those of current state-of-the-art SR methods. The significant performance improvement of our model is due to optimization by removing unnecessary modules in conventional residual networks. The performance is further improved by expanding the model size while we stabilize the training procedure. We also propose a new multi-scale deep super-resolution system (MDSR) and training method, which can reconstruct high-resolution images of different upscaling factors in a single model. The proposed methods show superior performance over the state-of-the-art methods on benchmark datasets and prove its excellence by winning the NTIRE2017 Super-Resolution Challenge[26].
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cites
Deep Residual Learning for Image Recognition
He, K., Zhang, X., Ren, S., & Sun, J. (2016) · 2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) · doi:10.1109/cvpr.2016.90 · Cited by 235,474
U-Net: Convolutional Networks for Biomedical Image Segmentation
Ronneberger, O., Fischer, P., & Brox, T. (2015) · Lecture notes in computer science · doi:10.1007/978-3-319-24574-4_28 · Cited by 99,404
Adam: A Method for Stochastic Optimization
Kingma, D. P., & Ba, J. (2014) · arXiv · doi:10.48550/arxiv.1412.6980 · Cited by 98,946
Accurate Image Super-Resolution Using Very Deep Convolutional Networks
Kim, J., Lee, J. K., & Lee, K. M. (2016) · 2016 IEEE Conference on Computer Vision and Pattern Recognition (CVPR) · doi:10.1109/cvpr.2016.182 · Cited by 7,870
Self-citationInception-v4, Inception-ResNet and the Impact of Residual Connections on Learning
Szegedy, C., Ioffe, S., Vanhoucke, V., & Alemi, A. (2017) · Proceedings of the AAAI Conference on Artificial Intelligence · doi:10.1609/aaai.v31i1.11231 · Cited by 4,636
Deep Residual Learning for Image Recognition
He, K., Zhang, X., Ren, S., & Sun, J. (2015) · arXiv · doi:10.48550/arxiv.1512.03385 · Cited by 4,196
Super-resolution from a single image
Glasner, D., Bagon, S., & Irani, M. (2009) · 2009 IEEE 12th International Conference on Computer Vision · doi:10.1109/iccv.2009.5459271 · Cited by 1,889
Cited by
The Unreasonable Effectiveness of Deep Features as a Perceptual Metric
Zhang, R., Isola, P., Efros, A. A., Shechtman, E., & Wang, O. (2018) · 2018 IEEE/CVF Conference on Computer Vision and Pattern Recognition · doi:10.1109/cvpr.2018.00068 · Cited by 14,623
SwinIR: Image Restoration Using Swin Transformer
Liang, J., Cao, J., Sun, G., Zhang, K., Van Gool, L., & Timofte, R. (2021) · 2021 IEEE/CVF International Conference on Computer Vision Workshops (ICCVW) · doi:10.1109/iccvw54120.2021.00210 · Cited by 4,734
ESRGAN: Enhanced Super-Resolution Generative Adversarial Networks
Wang, X., Yu, K., Wu, S., Gu, J., Liu, Y., Dong, C., Qiao, Y., & Loy, C. C. (2019) · Lecture Notes in Computer Science · doi:10.1007/978-3-030-11021-5_5 · Cited by 4,731
NTIRE 2017 Challenge on Single Image Super-Resolution: Dataset and Study
Agustsson, E., & Timofte, R. (2017) · 2017 IEEE Conference on Computer Vision and Pattern Recognition Workshops (CVPRW) · doi:10.1109/cvprw.2017.150 · Cited by 4,295
Transformers in Vision: A Survey
Khan, S., Naseer, M., Hayat, M., Zamir, S. W., Khan, F. S., & Shah, M. (2022) · ACM Computing Surveys · doi:10.1145/3505244 · Cited by 3,595
Metadata
- Authors
- Lim, B., Son, S., Kim, H., Nah, S., & Lee, K. M.
- Venue
- 2017 IEEE Conference on Computer Vision and Pattern Recognition Workshops (CVPRW)
- Publisher
- IEEE
- Published
- 2017-07
- Pages
- 1132-1140
- OpenAlex
- W2735224642
- Cited by
- 7,736
- References
- 7
- FWCI
- 127.17
- Type
- conference paper
- Language
- en
- Open access
- green
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.