The DOI matches its Crossref record; the references it cites are not checked yet.
Direct digital converter for a single active element resistive sensor
Abstract
A direct digital converter that provides a digital output, proportional to the measurand being sensed by a single active element resistive sensor is presented in this paper. To accomplish this task, the structure and the switching sequence of a conventional dual slope, analog to digital converter (DSADC) is appropriately altered so that the altered DSADC accepts the resistance of the sensor as an integral part and provides a digital output that is linearly proportional to the physical quantity being sensed by the resistive sensor. Since the output of the dual slope resistance to digital converter (DSRDC) is dictated only by the magnitudes of a pair of DC reference voltages, a fixed value resistor and the transformation constant of the sensor, the error in the output is minimal. Hence, a high level of linearity and accuracy is achieved. Simulation studies establish the efficacy of the proposed scheme.
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
The citation lists haven’t been fetched yet
References 13 · Cited by 20
Research works printed but not linked: 10
- 10.1109/19.728781 · DOI
- 10.1109/19.728780 · DOI
- mohan, 2007, dual slope resistance to digital converter, Proc IEEE Instrumentation Measurement Technology Conf (IMTC)
- doebelin, 2004, Measurement Systems - Application and Design
- george, 2006, switched capacitor triple slope capacitance to digital converter, Circuits Devices and Systems IEE Proceedings-, 153, 148, 10.1049/ip-cds:20050176 · DOI
- 10.1109/IMTC.2007.379382 · DOI
- 10.1109/19.836326 · DOI
- 10.1109/19.494596 · DOI
- 10.1109/IMTC.2005.1604150 · DOI
- 10.1109/TIM.1979.4314808 · DOI
Metadata
- Authors
- Madhu Mohan, N., & Jagadeesh Kumar, V.
- Venue
- 2009 IEEE Intrumentation and Measurement Technology Conference
- Publisher
- IEEE
- Published
- 2009-05
- Pages
- 828-831
- ISSN
- 1091-5281 (ISSN-L)
- OpenAlex
- W2134392963
- Cited by
- 20
- References
- 13
- Citations by year
- 2023: 3 · 2019: 2 · 2018: 3 · 2017: 3 · 2016: 4 · 2014: 3 · 2013: 1
- FWCI
- 0.69
- Type
- conference paper
- Language
- en
- Open access
- closed
- Locations
- Conference proceedings - IEEE Instrumentation/Measurement Technology Conference (publishedVersion)
- Topics
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Analog and Mixed-Signal Circuit Design
- Physical Sciences › Physics and Astronomy › Instrumentation › Sensor Technology and Measurement Systems
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Advanced Electrical Measurement Techniques
- Keywords
- resistive sensors, switching sequence, sensor linearity, sensor accuracy
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
