True Random Number Generator With a Metastability-Based Quality Control
Abstract
We present a metastability-based true random number generator that achieves high entropy and passes NIST randomness tests. The generator grades the probability of randomness regardless of the output bit value by measuring the metastable resolution time. The system determines the original random noise level at the time of metastability and tunes itself to achieve a high probability of randomness. Dynamic control enables the system to respond to deterministic noise and a qualifier module grades the individual metastable events to produce a high-entropy random bit-stream. The grading module allows the user to trade off output bit-rate with the quality of the bit-stream. A fully integrated true random number generator was fabricated in a 0.13 mum bulk CMOS technology with an area of 0.145 mm2.
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Oscillator-based TRNGs suffer from drawbacks including aging, frequency locking, technology dependence, high power consumption, and are vulnerable to frequency attacks leading to entropy loss.
“However, some drawbacks can hinder the usage oscillatorbased TRNGs, such as aging, frequency locking, technology dependence and highly power consumption [60], [61].What's worse, oscillator-based TRNGs suffer from frequency attacking easily [60], which can lead to entropy loss.”
From True Random Number Generators Using Electrical Noise (2019) · cites this paper as [60]
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References 10 · Cited by 172
- Authors
- Tokunaga, C., Blaauw, D., & Mudge, T.
- Affiliations
- University of Michigan (US)
- Venue
- IEEE Journal of Solid-State Circuits
- Published
- 2008-01
- Volume
- 43
- Issue
- 1
- Pages
- 78-85
- ISSN
- 0018-9200 (ISSN-L)
- OpenAlex
- W2177571745
- Semantic Scholar
- 935c87b7bfb25fed9038434785db96bd3c60802c
- Cited by
- 172
- References
- 10
- Citations by year
- 2026: 6 · 2025: 8 · 2024: 8 · 2023: 6 · 2022: 14 · 2021: 13 · 2020: 18 · 2019: 17 · 2018: 6 · 2017: 13 · 2016: 9 · 2015: 10 · 2014: 6 · 2013: 7 · 2012: 9
- FWCI
- 15.20
- Type
- journal article
- Language
- en
- Open access
- closed
- Locations
- IEEE Journal of Solid-State Circuits (publishedVersion)
- Topics
- Physical Sciences › Computer Science › Hardware and Architecture › Physical Unclonable Functions (PUFs) and Hardware Security
- Physical Sciences › Engineering › Biomedical Engineering › Analog and Mixed-Signal Circuit Design
- Physical Sciences › Engineering › Electrical and Electronic Engineering › Low-power high-performance VLSI design
- Keywords
- true random number generator, metastability, entropy (information theory), NIST randomness tests, dynamic control, integrated circuit design
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