The DOI matches its Crossref record.
In-Memory Computation of a Machine-Learning Classifier in a Standard 6T SRAM Array
Abstract
This paper presents a machine-learning classifier where computations are performed in a standard 6T SRAM array, which stores the machine-learning model. Peripheral circuits implement mixed-signal weak classifiers via columns of the SRAM, and a training algorithm enables a strong classifier through boosting and also overcomes circuit nonidealities, by combining multiple columns. A prototype 128 × 128 SRAM array, implemented in a 130-nm CMOS process, demonstrates ten-way classification of MNIST images (using image-pixel features downsampled from 28 × 28 = 784 to 9 × 9 = 81, which yields a baseline accuracy of 90%). In SRAM mode (bit-cell read/write), the prototype operates up to 300 MHz, and in classify mode, it operates at 50 MHz, generating a classification every cycle. With accuracy equivalent to a discrete SRAM/digital-MAC system, the system achieves ten-way classification at an energy of 630 pJ per decision, 113× lower than a discrete system with standard training algorithm and 13× lower than a discrete system with the proposed training algorithm.
Overview
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Integrity signals
Registry
Cites
Statistics
Verification
Claims the paper makes
The claims and statistics of this paper haven’t been checked yet.
Run the check — free, no account needed. It reads the open-access text and checks the sources it cites.
Self-check
Percentages, sums and reported differences re-computed from the paper’s own numbers.
The self-check needs the paper’s full text.
Citations
Cited by
Neuro-inspired computing chips
Zhang, W., Gao, B., Tang, J., Yao, P., Yu, S., Chang, M.-F., Yoo, H.-J., Qian, H., & Wu, H. (2020) · Nature Electronics · doi:10.1038/s41928-020-0435-7 · Cited by 892
In-Memory Computing: Advances and Prospects
Verma, N., Jia, H., Valavi, H., Tang, Y., Ozatay, M., Chen, L.-Y., Zhang, B., & Deaville, P. (2019) · IEEE Solid-State Circuits Magazine · doi:10.1109/mssc.2019.2922889 · Cited by 473
Self-citationScaling for edge inference of deep neural networks
Xu, X., Ding, Y., Hu, S. X., Niemier, M., Cong, J., Hu, Y., & Shi, Y. (2018) · Nature Electronics · doi:10.1038/s41928-018-0059-3 · Cited by 462
XNOR-SRAM: In-Memory Computing SRAM Macro for Binary/Ternary Deep Neural Networks
Yin, S., Jiang, Z., Seo, J.-S., & Seok, M. (2020) · IEEE Journal of Solid-State Circuits · doi:10.1109/jssc.2019.2963616 · Cited by 429
Biswas, A., & Chandrakasan, A. P. (2019) · IEEE Journal of Solid-State Circuits · doi:10.1109/jssc.2018.2880918 · Cited by 414
Metadata
- Authors
- Zhang, J., Wang, Z., & Verma, N.
- Venue
- IEEE Journal of Solid-State Circuits
- Published
- 2017-04
- Volume
- 52
- Issue
- 4
- Pages
- 915-924
- ISSN
- 0018-9200 (ISSN-L)
- 1558-173X
- OpenAlex
- W2591601611
- Cited by
- 532
- References
- 0
- FWCI
- 16.45
- Type
- journal article
- Language
- en
- Open access
- closed
About these checks
Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.
Statistics and arithmetic are recomputed, not judged.
Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.
What counts as a claim ›How we measure confidence ›How we check this ›
Are you an author, or do you see a problem with this page? Request a review
How to cite
Cite CoChat for the checks on this page, and the paper for its own findings.
- This page
- CoChat. (2026). Citation check: In-Memory Computation of a Machine-Learning Classifier in a Standard 6T SRAM Array. https://app.cochat.ai/papers/10.1109/jssc.2016.2642198
- The paper
- Zhang, J., Wang, Z., & Verma, N. (2017). In-Memory Computation of a Machine-Learning Classifier in a Standard 6T SRAM Array. IEEE Journal of Solid-State Circuits. https://doi.org/10.1109/jssc.2016.2642198
Data sources
Bibliographic data: Semantic Scholar, OpenAlex, Crossref.
Contains information from the Semantic Scholar Academic Graph Datasets, made available under the ODC Attribution License (ODC-BY 1.0).
Semantic Scholar’s data is described in: Kinney, R., et al. (2023). The Semantic Scholar Open Data Platform. arXiv:2301.10140.