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Current Imbalance Tests in Asymmetrical Parallel Connected IGBTs for High Current Applications
Abstract
This paper presents a static skewed IGBT gate drive, and investigates the impact to power semiconductor switching compared to the traditional double pulse method test. The method is able to test the performance of parallel connected insulated gate bipolar transistor (IGBT) modules for high current applications. The current-sharing between the parallel-connected IGBT modules is often addressed using gate-drive timing. However, using this test method, it is observed that poor sharing can be introduced by the di/dt arising from the switching in other legs in the inverter. We show current sharing behavior for different AC link arrangements, including quasi symmetrical and asymmetrical for three 300A IGBT modules. The experiments are presented for up to 250Vdc and a load current of around 800A. Regardless of AC link arrangement and in the presence of the di/dt in the load, the current sharing is easily upset. Lastly, a control signal is introduced to improve current sharing among parallel devices.
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Cited by 4
Research works printed but not linked: 12
- Hornkamp, 2024, AN2004-06 - Paralleling of EconoPACK
- 10.1109/ICPST61417.2024.10602119 · doi:10.1109/icpst61417.2024.10602119
- 10.1109/ACCESS.2021.3089495 · DOI
- 10.3390/en16145306 · DOI · Paper page
- 10.1109/ECCE.2019.8912737 · DOI
- 10.1109/IAS.2004.1348829 · doi:10.1109/ias.2004.1348829
- 10.1109/TDEI.2009.5211849 · DOI
- 10.1016/0038-1101(88)90025-1 · DOI
- 2024, 2QP0115Txx-C
- 10.1109/tpel.2003.816194 · DOI · Paper page
- 10.1109/IAS.2002.1042787 · DOI
- 10.1049/cp:19980532 · doi:10.1049/cp:19980532
Metadata
- Authors
- Palmer, P., & Agron, D.
- Venue
- 2024 IEEE 9th Southern Power Electronics Conference (SPEC)
- Publisher
- IEEE
- Published
- 2024-12-02
- Pages
- 1-7
- Cited by
- 4
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- Palmer, P., & Agron, D. (2024). Current Imbalance Tests in Asymmetrical Parallel Connected IGBTs for High Current Applications. 2024 IEEE 9th Southern Power Electronics Conference (SPEC). https://doi.org/10.1109/spec62217.2024.10893195
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