CoChat
Sign Up
Cited by 17Radiation Effects in ElectronicsAdvanced DC-DC ConvertersPhysical Unclonable Functions (PUFs) and Hardware Security

The DOI matches its Crossref record; the references it cites are not checked yet.

Digital Control for Radiation-Hardened Switching Converters in Space

Adell, P. C., Witulski, A. F., Schrimpf, R. D., Baronti, F., Holman, W. T., Galloway, K. F.·2010·IEEE Transactions on Aerospace and Electronic Systems
DOI 10.1109/taes.2010.5461655
Open this paper in CoChat — free account

Abstract

Single-event hardening solutions for two converter designs with digital control are considered for space radiation environments: 1) a boost converter using static random access memory (SRAM)-based field programmable gate arrays (FPGAs). In this case the hardening approach is based on duplication at both the logic and device levels and on a nondisruptive resynchronization mechanism that ensures the converter operation if single-event functional interrupt occurs. 2) An integrated buck converter that uses redundancy at the register level, as well as modification of the very high speed integrated circuit (VHSIC) hardware description language (VHDL) code. These hardening techniques are validated through experiments and simulations.

Overview

Integrity signals

Registry

Crossref · 10.1109/taes.2010.5461655

Cites

Statistics

Recomputing p-values needs the paper’s full text.

Verification

Claims the paper makes

This paper’s full text isn’t openly available, so its claims and self-check weren’t run. The registry and citation checks still apply.

Claims other papers make about this one

Each is checked against this paper’s own text: does it say what the citing paper says it does?

  • The main benefits of the non-isolated dc-dc converters covered are design simplicity and therefore greater reliability, fewer number of components, and consequently dry mass.

    “The main benefits of the converters covered in this subsection are design simplicity and therefore greater reliability, and fewer number of components, and consequently dry mass [59].”

    From A Comprehensive Review on Small Satellite Microgrids (2022) · cites this paper as [59]

Citations

The citation lists haven’t been fetched yet

References 19 · Cited by 17

Research works printed but not linked: 19

  1. 10.1109/REDW.2002.1045539 · DOI
  2. tastet, 1993, Burnout sensitivity of power MOSFET's operating in a switching converter, Proc IEEE 5th Eur Conf Radiation and Its Effects on Components and Systems (RADECS), 458
  3. 10.1109/23.124110 · DOI
  4. 10.1109/TNS.2002.805440 · DOI
  5. 10.1109/REDW.2002.1045538 · DOI
  6. 10.1109/REDW.1995.483377 · DOI
  7. 10.1007/b100747 · DOI
  8. 10.1049/el:20030913 · DOI
  9. 10.1109/RADECS.2001.1159326 · DOI
  10. carmichael, 1999, SEU mitigation techniques for Virtex FPGAs in space applications, Proceedings of the 2nd MAPLD International Conference
  11. 10.1109/23.489240 · DOI
  12. 10.1109/5.4425 · DOI
  13. 10.1109/TNS.2003.820757 · DOI
  14. 10.1109/TNS.2002.805425 · DOI
  15. 10.1109/TNS.2004.839194 · DOI
  16. 10.1109/23.903817 · DOI
  17. 10.1109/92.845892 · DOI
  18. 10.1109/ISIE.1995.497232 · DOI
  19. maree, 2001, Toward a single event hardness assurance methodology, Proc IEEE 5th Eur Conf Radiation and Its Effects on Components and Systems (RADECS), 343

Metadata

Authors
Adell, P. C., Witulski, A. F., Schrimpf, R. D., Baronti, F., Holman, W. T., & Galloway, K. F.
Affiliations
  • Jet Propulsion Laboratory (US)
  • Vanderbilt University (US)
  • University of Pisa (IT)
ORCID
Venue
IEEE Transactions on Aerospace and Electronic Systems
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Published
2010-04
Volume
46
Issue
2
Pages
761-770
ISSN
0018-9251 (ISSN-L)
DOI
10.1109/taes.2010.5461655
OpenAlex
W2095669699
Cited by
17
References
19
Citations by year
2022: 2 · 2021: 1 · 2019: 2 · 2018: 1 · 2017: 3 · 2016: 1 · 2015: 2 · 2013: 3 · 2012: 1
FWCI
1.26
Type
journal article
Language
en
Open access
closed
Licence
ieeexplore.ieee.org/Xplorehelp/downloads/license-information/IEEE.html (vor)
Locations
  • IEEE Transactions on Aerospace and Electronic Systems (publishedVersion)
  • CINECA IRIS Institutial research information system (University of Pisa) (submittedVersion)
Topics
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Radiation Effects in Electronics
  • Physical Sciences › Engineering › Electrical and Electronic Engineering › Advanced DC-DC Converters
  • Physical Sciences › Computer Science › Hardware and Architecture › Physical Unclonable Functions (PUFs) and Hardware Security
Keywords
radiation hardening, digital control, switching converters, space radiation, single event functional interrupt, SRAM-based FPGAs, buck converter, boost converter

About these checks

Registry, retraction, Cites and statistics results are computed, not judged, with one exception: a printed reference that no index lists is read once by a model before it counts as a citation error. Claims are extracted by a model and kept only when their quote appears verbatim in the text; each cited source is then checked, with a model’s help, for whether it says what the claim relies on. Those verdicts can be wrong — read the claim’s quote and the cited source before relying on one.

Statistics and arithmetic are recomputed, not judged.

Confidence bands are shown only for fields calibrated on our annotated test set. None is calibrated yet, so no band is shown.

What counts as a claim ›How we measure confidence ›How we check this ›

Are you an author, or do you see a problem with this page? Request a review